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Single Event Upset Test of Low Energy Proton on 65 nm SRAM
CAI Li;,CHEN Li;,FAN Hui;,GAO Li-juan;,GUO Gang;,HE An-lin;,KONG Fu-quan;,LIU Jian-cheng;,REN Yi;,SHEN Dong-jun;,SHI Shu-ting;,WANG Hui;,ZHANG Zhi-chao;
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