1000-7202
2002 Issue 1
Development Trends in Modern Microwave Measurement
tian bo ; zhen shu chun ; zhang yong shun
tian bo ; zhen shu chun ; zhang yong shun
..............page:61-64
The Applications of Computer's Parallel Interface in Metrology and Measurement
guo zhan shan ; mou neng ; zuo dao guang ; wang zeng hao
guo zhan shan ; mou neng ; zuo dao guang ; wang zeng hao
..............page:55-60
..............page:50-54
Interface Development of the Automatic Calibration System for the General Electricity Parameters
liu chuan xiang ; zhang chun yang ; qiao zhi hong
liu chuan xiang ; zhang chun yang ; qiao zhi hong
..............page:46-49
Foundation of Malfunction Auto-testing System of the Digital Oscilloscopes
shi li ; jia ping ; zhang zuo shi ; xia bing
shi li ; jia ping ; zhang zuo shi ; xia bing
..............page:42-45
The Error Analysis of Rise Time Measurement with an Oscilloscope
yu xue feng ; yu jie
yu xue feng ; yu jie
..............page:36-41
Study on Verification Method of Digital Oscilloscope
shen qi xiang ; shu yan ; yu li juan
shen qi xiang ; shu yan ; yu li juan
..............page:32-35
..............page:21-31
Testing System for the Dynamic Phase Noise
luo jian ; zhang xiang jing
luo jian ; zhang xiang jing
..............page:17-20
..............page:13-16,41
A Method of Measuring Microwave Source Reflection Coefficient Using High Mismatch Power Sensor
chen yun mei ; yang chun tao
chen yun mei ; yang chun tao
..............page:7-12
Miniaturization Research of Rubidium Atomic Frequency Standard
zhou zhong shi ; wang liang ; guo peng xiang
zhou zhong shi ; wang liang ; guo peng xiang
..............page:1-6,12