1000-7202
2000 Issue 4
ji liang jian ding xin xi de ji suan ji guan li xi tong
xiao chun hong ; tong jie
xiao chun hong ; tong jie
..............page:62-64
yong jie yue xin hao xiao zhun dong tai fen xi yi de tan tao
yang xiu jie ; zhou de xiang
yang xiu jie ; zhou de xiang
..............page:55-61
The application of single chip processor in testing insulation of missile equipment
Cai Zongping;Wang Yuegang;Liu Guangbin
Cai Zongping;Wang Yuegang;Liu Guangbin
..............page:51-54
The dynamic measurement method based on extended sequence
Li Guanhua;Xu Hualong
Li Guanhua;Xu Hualong
..............page:45-50
biao zhun zhuan su biao xiao yan zhuang zhi de yan zhi
cai zuo ; su fan ; li li
cai zuo ; su fan ; li li
..............page:42-45
Uncertainty evaluation of pressure leak calibration apparatus
Zhang Dixin;Zhang Jianjun;Xu Heng;Feng Yan;Gong Yueli
Zhang Dixin;Zhang Jianjun;Xu Heng;Feng Yan;Gong Yueli
..............page:36-41
Study of the micro-thrust automatic measurement system
Zhao Baorui;Li Jing;Jiang Jinwei
Zhao Baorui;Li Jing;Jiang Jinwei
..............page:31-35
The Experimental study for disturbance of the slip ring servo system on the main axis
Shao Changsheng;Ye Qing
Shao Changsheng;Ye Qing
..............page:26-30
..............page:24-25
The application of electric axis method in the measurement of precision capacitance transducer
Fu Jingye;Zhang Honggang;Zhao Yuchun;Guo Jing;Li Yueping;Zheng Yizhong
Fu Jingye;Zhang Honggang;Zhao Yuchun;Guo Jing;Li Yueping;Zheng Yizhong
..............page:17-23
A dynamic model in use for measuring piezoelectric parameters by piezoelectric bimorphs
Ye Huiying;Pu Zhaobang
Ye Huiying;Pu Zhaobang
..............page:11-17
The measurement techniques of 3D surface microtopography
Li Chenggui;Li Xingshan;Qiang Xifu
Li Chenggui;Li Xingshan;Qiang Xifu
..............page:2-10