1671-4776
2011 Issue 5
Dynamic Characteristics Analysis of MEMS Capacitive Accelerometers
Xu Shujing;Yang Yongjun
Xu Shujing;Yang Yongjun
..............page:321-325,332
Research Development of MEMS Micro-Gyroscopes
Cheng Yuxiang;Zhang Weiping;Chen Wenyuan;Cui Feng;Liu Wu;Wu Xiaosheng
Cheng Yuxiang;Zhang Weiping;Chen Wenyuan;Cui Feng;Liu Wu;Wu Xiaosheng
..............page:277-285
Reliability Analysis of Power Devices by Infrared(IR) Thermography
Liang Faguo;Zhai Yawei;Wu Aihua
Liang Faguo;Zhai Yawei;Wu Aihua
..............page:338-342
Current Behavior in Electrospinning and Its Application in Morphology Control
Gu Dandan;Wang Lingyun;Sun Daoheng;Xi Wenming
Gu Dandan;Wang Lingyun;Sun Daoheng;Xi Wenming
..............page:305-310
Two-Dimensional Quantum Simulation of Gate Leakage Current in Nanoscale Double Gate MOSFETs
Tang Rui;Wang Hao;Chang Sheng;Hu Yue;Wang Gaofeng
Tang Rui;Wang Hao;Chang Sheng;Hu Yue;Wang Gaofeng
..............page:286-290
..............page:285,343-344
Structure Analysis of Thermo-Optical Induced Microfluidic Waveguide
Ding Lijuan;Li Yongqian;Guo Haiwen;Wang Ningbo
Ding Lijuan;Li Yongqian;Guo Haiwen;Wang Ningbo
..............page:315-320
808 nm Wavelength Locked High Power Semiconductor Laser Array
An Zhenfeng;Huang Ke;Deng Haili
An Zhenfeng;Huang Ke;Deng Haili
..............page:296-299
Reliability Study of 1-bit QCA Comparators
Huang Hongtu;Cai Li;Peng Weidong;Bai Peng;Yang Xiaokuo;Li Zhengcao
Huang Hongtu;Cai Li;Peng Weidong;Bai Peng;Yang Xiaokuo;Li Zhengcao
..............page:291-295
Releasing of Micro Impending Structures Based on 3D Mask and Si-Based Anisotropic Etching Processes
Huang Zhanxi;Wu Yaming
Huang Zhanxi;Wu Yaming
..............page:326-332
Study of Photoluminescence from CdSe Nano-Tetrapods
Zhao Lijuan;Lu Aijiang;Pang Qi;Ge Weikun;Wang Jiannong
Zhao Lijuan;Lu Aijiang;Pang Qi;Ge Weikun;Wang Jiannong
..............page:300-304,310
Gas Bubble Liquid Membrane Process for Preparation of Nanosized Ferrite Precursors
Zeng Neng;Yang Lin;Li Zongbao;Yang Dilun
Zeng Neng;Yang Lin;Li Zongbao;Yang Dilun
..............page:311-314,320
Extraction Efficiency of GaN LEDs Improved by Low Damage ICP Etching Technique
Pan Lingfeng;Li Qi;Yi Xiaoyan;Fan Zhongchao;Wang Liangchen;Wang Junxi
Pan Lingfeng;Li Qi;Yi Xiaoyan;Fan Zhongchao;Wang Liangchen;Wang Junxi
..............page:333-337