1671-4776
2003 Issue 6
..............page:48-48
..............page:46-47
..............page:46-46
Measurement on the strain of elastic diaphragm of silicon dual-E structure by laser beam imaging
deng yong he
deng yong he
..............page:43-45
Technology and application of STM·IPC-205B
liu gui fen ; zhong hong jie ; yang xue heng
liu gui fen ; zhong hong jie ; yang xue heng
..............page:39-42
Improvement of etched surface of silicon (110)plane using an iodine-supersaturated KOH etchant
jing yu peng ; qian zhong yi jie ; teng tian xiao zhi ; gao shan yang yi lang
jing yu peng ; qian zhong yi jie ; teng tian xiao zhi ; gao shan yang yi lang
..............page:33-38
Study of the display technique of microlens array
dong xiao chun ; du chun lei
dong xiao chun ; du chun lei
..............page:29-32,45
Growth of InGaAs/In0.32≤x≤0.52Al1-xAs MM-HEMTs materials by MBE
qiu kai ; zhang xiao juan ; chen jian lu
qiu kai ; zhang xiao juan ; chen jian lu
..............page:26-28
Characteristic and preparation of nano gassensitive materials by spraying coprecipitation
liu jin huai ; jiao zheng ; zhang jian ; yu zeng liang
liu jin huai ; jiao zheng ; zhang jian ; yu zeng liang
..............page:22-25,42
Research advances of gas nanosensors
ren hong liang ; he jin tian ; liang er jun ; tian zhen feng
ren hong liang ; he jin tian ; liang er jun ; tian zhen feng
..............page:16-21
The investigation of noise in nanoelectronic devices and its application
zhang zhi yong ; wang tai hong
zhang zhi yong ; wang tai hong
..............page:6-15
Consideration of GaN IC development
yuan ming wen
yuan ming wen
..............page:1-5