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Global Electronics China
1006-7604
2006 Issue 5
Editorial Comment
..............page:8
ye jie yao wen
..............page:105-106
intersil: xin nian xin qi dian
zuo jing yu
..............page:98
The Video Applications of Blackfin Processor
adi gong si
..............page:94-97
New Components of The Month
..............page:77-86
RF Wafer Testing: an Acute Need, and Now Practical
Carl Scharrer
..............page:72-75
Challenges of SOC Test in Emerging Market
Mike Evon
..............page:70-71
Freescale Continually Keep Ahead in High Integrated E-field Technology
fei si ka er ban dao ti
..............page:67-68
A Reference Design for High-Performance Low-Cost Weigh Scales
Colm Slattery;Mariah Nie
..............page:59-64
lcd yu oled qu dong ic chan ye yan jiu
zhou yan wu
..............page:57-58
ri xin yue yi de zhong guo dian zi zhi zao ye
Amy Wang
..............page:54-57
Technology News
..............page:16-18
zhong guo pc shi chang zou shi fen xi
William Bao Bean
..............page:52-54
xin xing fen xiao shang mo shi tan jiu
qin cang fa
..............page:49-52
ban dao ti shen hua -- wei lai ban dao ti xu qiu de zhen li
yin jian song
..............page:48-49
Living Life Off of a Battery Using MCU
Mark E.Buccini
..............page:34-36
Smart Real- Time Clock for Embedded Applications
Ross Bannatyne
..............page:26-28