Home | Survey | Payment| Talks & Presentations | Job Opportunities
Journals   A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Tsinghua Science and Technology
1007-0214
2007 Issue z1
Parameter Optimization of Linear Quadratic Controller Based on Genetic Algorithm
LI Jimin;SHANG Chaoxuan;ZOU Minghu
..............page:208-211
A New Method for Measurement and Reduction of Software Complexity
SHI Yindun;XU Shiyi
..............page:212-216
A Novel Quantitative Analysis Model for Information System Survivability Based on Conflict Analysis
WANG Jian;WANG Huiqiang;ZHAO Guosheng
..............page:217-222
SIP Conformance Testing Based on TTCN-2
LI Tian;WANG Zhiliang;YIN Xia
..............page:223-228
Test Mismatch in Switched-Current Circuits Using Wavelet Analysis"
GUO Jierong;HE Yigang;LIU Meirong;TANG Shengxue;LI Hongmin
..............page:229-234
Arithmetic Operand Ordering for Equivalence Checking
WENG Yanling;GE Haitong;YAN Xiaolang;Ren Kun
..............page:235-239
Structural Fault Tolerance of Scale-Free Networks
HAO Jingbo;YIN Jianping;ZHANG Boyun
..............page:246-249
Practical Strategies to Improve Test Efficiency
DING Zhigang;WANG Hongcheng;LING Lianghe
..............page:250-254
HEAD: A Hybrid Mechanism to Enforce Node Cooperation in Mobile Ad Hoc Networks
QUO Jianli;LIU Hongwei;DONG Jian;YANG Xiaozong
..............page:202-207
Fault-Tolerant Design and Testing of USB2.0 Peripheral Devices IP Core System
BAI Xiaoping;WEI Yuanfeng
..............page:197-201
Online Distributed Fault Detection of Sensor Measurements
GAO Jianliang;XU Yongjun;LI Xiaowei
..............page:192-196
Fault-Tolerant Mechanism of the Distributed Cluster Computers"
SHANG Yizi;JIN Yang;WU Baosheng
..............page:186-191
Test Generation with Unspecified Variable Assignments
LI Guanghui;FENG Dongqin
..............page:180-185
Soft Fault Diagnosis for Analog Circuits Based on Slope Fault Feature and BP Neural Networks
HU Mei;WANG Hong;HU Geng;YANG Shiyuan
..............page:26-31
Deterministic Circular Self Test Path
WEN Ke;HU Yu;LI Xiaowei
..............page:20-25
Out-of-Bounds Array Access Fault Model and Automatic Testing Method Study
GAO Chuanping;DUAN Miyi;TAN Liqun;GONG Yunzhan
..............page:14-19
Improving Rollback-Recovery Efficiency by Tuning Pessimism Grain
YANG Jinmin;ZHANG Dafang;LI Kin Fun;CHENG Jing
..............page:8-13
On-Chip Multi-Giga Bit Cycle-to-Cycle Jitter Measurement Circuit
ZHANG Jingkai;Chung Len Lee;TIAN Chao;YU Fei
..............page:1-7
A Novel Formal Analysis Method of Network Survivability Based on Stochastic Process Algebra
ZHAO Guosheng;WANG Huiqiang;WANG Jian
..............page:175-179
Fault Tolerance Mechanism in Chip Many-Core Processors
ZHANG Lei;HAN Yinhe;LI Huawei;LI Xiaowei
..............page:169-174
Fault-Tolerant Technique in the Cluster Computation of the Digital Watershed Model
SHANG Yizi;WU Baosheng;LI Tiejian;FANG Shenguang
..............page:162-168
Extended Logistic Chaotic Sequence and Its Performance Analysis
ZHANG Xuefeng;FAN Jiulun
..............page:156-161
Application of Dynamic Slicing in Test Data Generation
QUO Suwei;ZHAO Ruilian;LI Lijian
..............page:150-155
Mapping of Irregular IP onto NoC Architecture with Optimal Energy Consumption
LI Guangshun;WU Junhua;MA Guangsheng
..............page:146-149
A Novel Testability-Oriented Data Path Scheduling Scheme in High-Level Synthesis
CHENG Benmao;WANG Hong;YANG Shiyuan;NIU Daoheng;JIN Yang
..............page:134-138
Efficient Fault Tree Analysis of Complex Fault Tolerant Multiple-Phased Systems
MO Yuchang;LIU Hongwei;YANG Xiaozong
..............page:122-127
Design and RAMS Analysis of a Fault-Tolerant Computer Control System
WANG Shuai;JI Yindong;DONG Wei;YANG Shiyuan
..............page:116-121
Low-Overhead Non-Blocking Checkpointing Scheme for Mobile Computing Systems
MEN Chaoguang;CAO Liujuan;WANG Liwen;XU Zhenpeng
..............page:110-115
TSHOVER: A Novel Coding Scheme for Tolerating Triple Disk Failures in RAID/DRAID
NA Baoyu;ZHANG Yusen;LIU Lili;LIU Peng
..............page:39-44
Fuzzy Logic-Based Secure and Fault Tolerant Job Scheduling in Grid
WANG Cheng;JIANG Congfeng;LIU Xiaohu
..............page:45-50
Novel Software Automated Testing System Based on J2EE
PEI Songwen;WU Baifeng;ZHU Kun;YU Qiang
..............page:51-56
A Novel Register Allocation Algorithm for Testability
SUN Qiang;ZHOU Tao;LI Haijun
..............page:57-60
Re-Optimization Algorithm for SoC Wrapper-Chain Balance Using Mean-Value Approximation
NIU Daoheng;WANG Hong;YANG Shiyuan;CHENG Benmao;JIN Yang
..............page:61-66
Non-Intrusive Design of Self-Checking FSM Based on Convolutional Codes
LI Ming;XU Shiyi;WAN Fayu;GU Jianwei;PENG Mingming;JIANG Jinsai
..............page:73-77
Oscillation Test Strategy for Analog Filters by Monitoring Output Voltage and Supply Current
HU Geng;WANG Hong;HU Mei;YANG Shiyuan
..............page:78-82
Helix Scan: A Scan Design for Diagnosis
WANG Fei;HU Yu;LI Xiaowei
..............page:83-88
Improved Data Compression Scheme for Multi-Scan Designs
LIN Teng;FENG Jianhua;Wang Yangyuan
..............page:89-94
Reliable and Energy Efficient Protocol for Wireless Sensor Network
KAN Baoqiang;CAI Li;XU Yongjun
..............page:95-100
Testing Jitter on PLL Clocks Based on Analysis of Instantaneous Phase
ZHU Yanqing;HE Yigang;FANG Gefeng;YANG Hui;QI Shaozhong;LIU Hui
..............page:101-104
Diagnosability of the Incomplete Star Graphs
ZHENG Shuxia;ZHOU Shuming
..............page:105-109
GASA Hybird Algorithm Applied in Airline Crew Rostering System
ZHANG Yinghui;RAO Yunbo;ZHOU Mingtian
..............page:255-259
Hierarchical Neural Networks Method for Fault Diagnosis of Large-Scale Analog Circuits
TAN Yanghong;HE Yigang;FANG Gefeng
..............page:260-265
Exploration of Complexity in Software Reliability
CHU Yanming;XU Shiyi
..............page:266-269
Analog Circuit Testability for Fault Diagnosis
CAI Jinyan;HAN Chunhui;MENG Yafeng
..............page:270-274
Information for Contributors
..............page:封3