1672-6030
2006 Issue 1
Effect of Pulse Duration on Fabrication Results of AFM Tip Induced Oxidation
LI Min;LIU Qing-gang;KUANG Deng-feng;GUO Wei-lian;ZHANG Shi-lin;ZHANG Shan;HU Xiao-tang
LI Min;LIU Qing-gang;KUANG Deng-feng;GUO Wei-lian;ZHANG Shi-lin;ZHANG Shan;HU Xiao-tang
..............page:79-82
A Large-Scale Aspheric Surface Ultra-Precision Hybrid Machine Tool
LI Guo;DONG Shen;ZHANG Jing-he;WANG Hai-feng;ZHANG Shun-guo
LI Guo;DONG Shen;ZHANG Jing-he;WANG Hai-feng;ZHANG Shun-guo
..............page:75-78
Ultrasonic Mechanical Polishing of End Face of Fiber Optic Connector
LI Xin-he;WANG Long;ZHONG Jue
LI Xin-he;WANG Long;ZHONG Jue
..............page:67-74
Application of SSDA-Based Template Matching Method in Fingerprint Identification
LI Yan-feng;XU Ke-xin;LIU Jin;WEN Hui-zhi
LI Yan-feng;XU Ke-xin;LIU Jin;WEN Hui-zhi
..............page:63-66
Electronic Speckle-Shearing Patten Interferometry for Vibration Analysis
JING Chao;JING Wen-cai;XU Tian-hua;LIU Na;ZHOU Ge;ZHANG Yi-mo
JING Chao;JING Wen-cai;XU Tian-hua;LIU Na;ZHOU Ge;ZHANG Yi-mo
..............page:58-62
A New Optical Noncontact Probe with Four Incidence Lights and a Receptor
ZHANG Guo-xiong;NA Yong-lin;GUO Jing-bin;FAN Yu-ming;QIU Zu-rong;DU Ying;XIE Ze-xiao
ZHANG Guo-xiong;NA Yong-lin;GUO Jing-bin;FAN Yu-ming;QIU Zu-rong;DU Ying;XIE Ze-xiao
..............page:54-57
Design and Analysis of a Lateral Lateral DC-Contact MEMS RF Switch with High Performance
FAN Wei;GUO Hui-yong;SHI Wen-dian;CHEN Jing
FAN Wei;GUO Hui-yong;SHI Wen-dian;CHEN Jing
..............page:46-53
Design and Development of Tunable Filters for MEMS Adaptive Infrared Detectors
HUANG H;WINCHESTER K W;DELL J M;FARAONE L
HUANG H;WINCHESTER K W;DELL J M;FARAONE L
..............page:38-45
Vibration-Assisted Tapping with Piezoelectric Actuation
WANG Xin-ting;ZHANG Bi
WANG Xin-ting;ZHANG Bi
..............page:25-37
Electrochemical Fabrication of Bi2Te3 Nanowire Arrays for Thermoelectric Micro-Generator
JIA Fa-long;WANG Wei;HUANG Qing-hua;ZHU Jing
JIA Fa-long;WANG Wei;HUANG Qing-hua;ZHU Jing
..............page:20-24
Metrological Scanning Probe Microscopy Applied for Calibrations of Micro- and Nanoscale Transfer Standards
DAI Gao-liang;KOENDERS Ludger;DANZEBRINK Ulrich;WILKENING Günter;ZHOU Jian-xiong;CHEN Zhen-yu
DAI Gao-liang;KOENDERS Ludger;DANZEBRINK Ulrich;WILKENING Günter;ZHOU Jian-xiong;CHEN Zhen-yu
..............page:10-19
Nanopositioning Control on a Commercial Linear Stage by Software Error Correction
FAN Kuang-chao;CHENG Fang;CHEN Ye-jin
FAN Kuang-chao;CHENG Fang;CHEN Ye-jin
..............page:1-9