Home | Survey | Payment| Talks & Presentations | Job Opportunities
Journals   A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Metrology & Measurement Technology
1002-6061
2001 Issue 1
san wei zuo biao xi zai he dian ye pian jian ce zhong de xuan ze yuan ze he ji qiao
liu ying qiu ; shi wen zhong ; wang tao
..............page:44-46
Effect of Test Force Error of Rockwell Apparatus on Indicating Value of C Scale
Liang Tingwei;Wang Qi;Zhang Kaiyuan;Fang Lixiang
..............page:39-41
Method of Eliminating Error Caused by User's Aid-hardware during the Test of VLSI Chip
Shen Senzu;Shi Jian;Wang Xilin
..............page:36-38
Simulation Study of Modern Measurement System
Yue Ruihua;Xu Hualong
..............page:11-12,23
Contrast and Analysis of ISO/IEC 17025 with ISO/IEC Guide 25
Wu Ting;QI Jianhua
..............page:3-10
Standard Dynamometer with X Force Measuring Cell
LIAN Gang
..............page:30,46
Attitude Error Correction Method of Measurement of Aircraft Fuel
Yuan Mei;Lin Ke;Cui Degang
..............page:24-26
Accurate Measurement of Gauge Block Length Using Phase-stepping Interferometry
Zhu Zhenyu;Niu Lixin;Yan Xin;Zhang Fugen;Ren Dongmei
..............page:20-23
Fire Angle Correction of Ship-based Cannon
He Ying;Zhang Zhimin
..............page:16-19
Composite Technique and Its Application of Digital Frequency and Waveform
Shi Guowei;Chen Ming;Wang Qing;Wang Feng
..............page:13-15,19