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Optical Instruments
1005-5630
2002 Issue 1
TECHNICAL INFORMATION AND STANDARDIZATION
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page:48
A certain number of questions about specifications and test of optical elements
xu de yan
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page:35-47
Omnidirectional reflecting multilayer dielectric film stack
wu dong sheng ; liu xu ; li hai feng
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page:30-34
Some methods of raising LaF3(Eu2+.Ca2+)crystal quality
kong bao guo ; chen rui fang
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page:27-29
The driving of non-matching image board in LabVIEW
fang zheng ; zheng gang ; ji feng ; li meng chao ; zhuang song lin
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page:23-26
Computer simulation of LED screen
yang rong ; chen xiang xi
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page:16-22
Designed principle of the rotational stand uses for measuring a camber with double focuses
lv zheng ; yao he jun ; lin yan dong
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page:13-15
Three-dimensional microscopic imaging of internal structures of biological specimens
rao zuo ; huang feng
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page:7-12
Serial-port communication technology applied for color measurement instrument
liu lian feng ; jiang yue juan
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page:3-6