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Journals   A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Electronics Quality
1003-0107
2013 Issue 4
Failure Analysis of Mobile Phone Automatic Dialing
Liu Xue-sen;Xu Dan-hong;Chai Yan-qiu;Chen Xu-dong
..............page:28-33
A Power Battery Active Management System
Zhang Zhi-yong;Li Xin-yan;Liu Xiao-li;Wang Ji-kai
..............page:47-49
Failure Analysis of Temperature Measurement Circuit in Cold Climate Condition
Xu Chun-juan;Zhang Hong-bo
..............page:92-95
Joint Time-frequency Opportunistic Spectral Access Algorithm for Wireless Communication Systems
Wang Yu-bo;Wang Cheng-gui;Li Chao;Huang Meng-meng
..............page:61-64
xin xi dong tai
..............page:69,73-75,96,后插1
Multiple Input Mining Intrinsically Safe Power Supply Design
Si Duan-bo;Fang Xu-peng
..............page:1-7,40
"One-station"Quality Management of System Integration Products
Fan Wei-ping;Wang Jun
..............page:70-72
Learning ISO/IEC 17025:2005 Perception
Qin Feng
..............page:76-77,83
Research of Logical Channel Mapping to Physical Channel in GMR-1 System
Wu Cong-ming;Shi Yang;Qian Ceng
..............page:8-15
Analysis of the Physical Amd Chemical Changes Produced in Flux Process of Using
Xu Huan-xiang;Cai Ying-ying
..............page:78-83
Research about the Remote Measurement and Control Module Based on the SOC Microcontroller
Dong Bing-long;Tao An-li;Wang Ji-ling;Li Xun;Jiang Yu-long;Zhao You-bo
..............page:16-19
Mobile Phone Touch Screen Analysis of Trace Material Evidence Identification of Intellectual Property
Wang Xiao-yun;Zhang Jing;Gao Wei;Zhang Xu;Zheng Hai-peng;Chai Yan-qiu;Chen Xu-dong
..............page:84-86,95
Design and Performance Evaluation of the Short-wave Wideband Waveform
Li Zhen-hai;Cheng Yun-peng;Yu Sheng
..............page:20-24
Application of SEM in Research and Development of Aluminum Electrolytic Capacitor
Zhao Yong-gang;Chen Ming-jie;Liu Li-xia
..............page:87-91