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Electronics Quality
1003-0107
2011 Issue 9
kigol long zhong tui chu si da jin gang zhi yi dg4000 xi lie shuang tong dao han shu ren yi bo xing fa sheng qi
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page:55-55
Evaluating the Measurement Uncertainty in Lumens Efficacy Testing of Self-ballasted LED Lamps
lin jin qiang
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page:59-60
Error Analysis and Processing of Resistive Touch-panel Linear
wang chun feng
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page:7-9,26
Reliability Analysis of Dependent Series System with Copula Function
jiang zuo
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page:17-19
wo guo yun fu wu biao zhun you wang luo di guo nei chang shang jiang huo li
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page:57-57
kenesas mobile corporation yu an li gong si he zuo ti gong shou pi huo de 3gpp ren ke de mimo ce shi an li
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page:57-57
ai mo sheng wang luo neng yuan tui chu yi xi lie 25w de gao xiao lv led zhao ming dian yuan
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page:56-56
The Implementation of Multiple Threads Executed Concurrently Based on DSP/BIOS
xu zuo ; qu zuo zuo
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page:1-3,6
st tui chu shi chang shang zui xiao de 3 zhou mo ni tuo luo yi
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page:55-55
ul ctdp shi yan shi cheng li tong guo hai er jian ce ke huo guo ji ren zheng
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page:56-56
NEBS GR-63-CORE Fire Spread Testing
li ju huan
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page:74-76
zhong guo 5 jia zheng fu bu men he zuo tui guang svac biao zhun
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page:57-57
A Design of McBSP Interface for Multiple Rate Matching Based on Ping-Pong Catching in Two FIFO
xu ping ; zuo hong cheng ; xu zuo
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page:29-31,48
RFID Testing in Anechoic Chamber:Design of a Chamber
yang wen zuo
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page:79-80
An IMM-PDA Based on Enlarged Gate by Searching
li ya xing ; cheng zuo
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page:45-48
Design and Simulation of Digital Down Conversion in Communications System
zhang li li
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page:10-13
Based on the PIC Microcontroller Electrothermal Shear's Control Circuit Design
yu a ling
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page:27-28,41
siliconbbs zhen dui zhong guo guang kuo de dian shi shi chang tui chu xin yi dai dian shi diao xie qi ic
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page:56-56
The Application of 6Sigma Management to JCET Semicon Package Process( II )
hu hui ming ; wu xiao yan
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page:49-52
The Design for Mutual Inductance of the DC Development
fu yu ; zhang yong hui
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page:69-70,73
Design of Embedded Signal Generator Based on MSP430F5438 and AD9850
he bing nian ; xu ming
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page:14-16
yi lai chu wei ying dui lte ce shi jia da yi qi ku cun
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page:56-56
huo ni wei er fa bu xin humidicontm shu zi shi wen shi du chuan gan qi
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page:55-55
Volt Ampere Phase Detection Algorithm Based on All Phase FFT
lu xin ning ; zhang yong hui
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page:71-73
Application of Inductive Electric Power Transmission in the Lithium Battery
liu xia ; zhang xin ; xiao feng ; wang tai hui ; li qi yuan
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page:42-44,52
The Design of Digital Filter Based on FPGA
zhang xiao mei ; zhao dong e ; feng yan jun ; yu shuang
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page:39-41
fei li pu cai yong lian fa ke ji quan xi lie led dian shi xin pian jie jue fang an
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page:57-57
Solutions on the Problems of High Voltage Switch of Surge Generator
hu hong jiang
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page:77-78
aeroflexpxi3000 xi lie zhu li xiang gang xin ke shi ye you hua chan neng
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page:57-57
Influence of New Static Standard to ESD Simulator
huang xiang yun ; jiang ning ; chen chuan lu
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page:58-58,65
maxim tui chu ju you kuan shu ru dian ya fan wei de h qiao bian ya qi qu dong qi max13256
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page:56-56
Improved Collaborative Allocation Algorithm and Its Application in Reliability Allocation
lu peng
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page:23-26
bo shi kao kao ni
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page:81-81,80
New Design and Realization of the Motor Driver Circuit for the Intelligent Car
chen jun ; yang shu qiang ; wang jun qiang
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page:32-34
Inductive Charging Technology and Its Application to the Portable and Sealing Devices
zeng hai tao
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page:66-68
de zhou yi qi tui chu ye jie zui gao jing du dian liu fen liu jian ce qi
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page:55-55
An Algorithm on Network Reliability Based on Pathset Matrix
gao hui sheng ; zhan jing yu ; wang bo ying
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page:20-22
Design of High Speed Sample and Hold Circuit
zhao yan ; jing shou zuo
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page:4-6
Implement of Transmission the TS Stream Based on Wireless Image
zuo hong cheng ; shi dong yuan ; li chao hai
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page:35-38,54
bo shi shou yu adi gong si 2009 2010 nian du zui jia gong ying shang cheng hao
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page:57-57
Teaching Reform of Electronic Technology Based on CDIO Model
li ruo qiong ; luo ying hong ; tao cai xia ; tian jing jing
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page:53-54
Automatic Test of Conventional Electrical Property of Connector Cable Component(I)
yang fen wei
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page:61-65