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Electronics Quality
1003-0107
2008 Issue 9
A Test Generation Algorithm of Combination Circuit Based on Neural Networks
Yang Xing;Xie Zhi-yuan;Yu Xiao-dong
..............page:1-3
The Signal Analysis of Nonideal DDS and its Filter
Chen Yue;Tian Shu-lin;Liu Ke
..............page:4-7
Microwave Sampler Designing Technique
Zhang Yong-po;Liu Cong-yue
..............page:8-9
Design of a Military Test System Base on LXI
Chen Xing-min;Yang Hai-tao;Zhu Jian
..............page:10-12
The Study of Software-Defined Radio Based on The Third Generation Communication
Zhang Shu-qiang;Zhu Shou-zhong;Jin Yong-jie
..............page:13-14
Developing Singleton User-defined Genereal Prompt Box with GTK+
Wu Bei;Huang jian-guo
..............page:15-17
The Application of the Union in the Design of The Digital Storage Oscilloscope
Teng Zhi-chao;Xie Xiang-nan;Zhang Qin-chuan;Tian Shu-lin
..............page:18-19
A Test Method of Mobile Phone Receiver Input Power
Luo Jian
..............page:20-22
Temperature and Humidity Monitoring System Based on JNS139 Module
Kang Lin;Gao Wen-hua
..............page:23-25
Fault Positioning Technology Based on the Purpose of Measurement
Zhou Xiao-ping;Li Yuan;Zhou Hui
..............page:26-27
New Products
..............page:31-32
Creditability Design for PCB in Embedded System
Cui Yu-lian
..............page:33-34
Reliability Allocation Through Cost Minimization
Liu Xue-feng;Li Ya-ping
..............page:38-41
Standardization Management for Material
Liu Hong
..............page:43-45
Experimental Data Analysis on the Secondary Screening of IC
Zhong Yue-hong
..............page:45-48
Industry Focus
..............page:58-60
FCC Certification for Cellphone
Di De-hai
..............page:62-64
Cases from Quality Doctor
..............page:88
Practice of EMC Design in Printed Circuit
Kong De-hai
..............page:83-85
FDTD Applications to Shielding Characteristic of Metallic Box with Apertures
Zhou Shan;Zhang Zhen-xin;Shen Hua-chun
..............page:80-82
The Suppression of Near Field Noise
Yang Wen-lin
..............page:77-79
Design of Automatic Test System for Insertion Loss in EMI Power Filter
Wang Meng;Zhou Ping
..............page:71-76
Differences between GB8898-2001 and GB4943-2001 for Adapter
An Chuang-wen;Lin Lan-fen
..............page:69-70,79
Standards and Testing for Automobile EMC
Sun Wei;Tong Zhu-jue
..............page:65-68