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Electronics and Packaging
1681-1070
2011 Issue 11
The Second Breakdown and Testing of Transistor
wang jing xia ; wang pin ying ; shen yuan sheng
..............page:9-13
Dynamic Phasors in Modeling and Analysis of PWM DC/DC Converter
ye wei hua ; li fu peng ; wang yong feng
..............page:22-28
0.6μm SOI NMOS ESD Performance Analysis and Application
luo jing ; hu yong qiang ; zhou yi ; zou qiao yun ; chen jia peng
..............page:33-36,40
Study and Improvement on Floating Gate CMP Process in Embedded Flash Memory
li guan hua ; huang qi zuo
..............page:4-8,13
Introduced the Advantages and Disadvantages of the Green Flame Retardant of EMC
li jin ; wang dian nian ; yuan lu lu
..............page:41-44
Design of Sample-and-hold Circuit for a Pipeline ADC
zhou jia ning ; li rong kuan
..............page:18-21,32
Research of LVDS Test Technology
chai hai feng ; zhu wei liang ; zhang hui bin ; wu qian wen
..............page:14-17
Analysis on the Influence of the Downset of Die Pad on Pinhole
shi hai zhong ; chen qiao feng ; zhu jin hui ; jia hong mei
..............page:1-3,17