1681-1070
2008 Issue 8
The Course and Development of PLD
PAN Rui-jie;CHEN Biao;LIU Xi-an
PAN Rui-jie;CHEN Biao;LIU Xi-an
..............page:44-48
Research on ESD Protection Circuit with Vertical NPN Structure in Submicron BiCMOS Technology
WANG De-jin;NIE Wei-dong;ZHANG Wei;LI Bing
WANG De-jin;NIE Wei-dong;ZHANG Wei;LI Bing
..............page:39-43
..............page:35-38
The Logic Analysis of I2C Bus Interface
RUAN Yuan;LI Jing
RUAN Yuan;LI Jing
..............page:31-34
Design of a 12-bit 25MS/s Sample and Hold Circuit
ZHONG Tao;LI Ying;CHEN Zhen-hai
ZHONG Tao;LI Ying;CHEN Zhen-hai
..............page:28-30,34
The Behavioral Level Simulation of a 2-1-1 MASH ∑-△ Modulation
YANG Dong-ze;WU Jin
YANG Dong-ze;WU Jin
..............page:22-27
Design of SoC Development Interface Based on JTAG
ZHANG Meng-hua;ZHANG Tao;ZHANG Peng
ZHANG Meng-hua;ZHANG Tao;ZHANG Peng
..............page:18-21,27
Research on Test Technology of DMAD on V777 Test System
LU Qiang;SUN Xiao-li
LU Qiang;SUN Xiao-li
..............page:13-17
Challenges of the Transformation from PBGA to FBGA
WANG Ting-qing
WANG Ting-qing
..............page:9-12,17
On the Reliability of the Sn-Ag-Cu Solder Material
HOU Rui-tian
HOU Rui-tian
..............page:5-8
Parallel Seam Welding and Lids
HOU Zheng-jun;SONG Bei-gang;DING Peng
HOU Zheng-jun;SONG Bei-gang;DING Peng
..............page:1-4,8