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Electronics and Packaging
1681-1070
2007 Issue 9
xin xi bao dao
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page:3,11,39,43-46
Analasys Principal Factors and Aftereffect of Influence Good Quality in PIP
MU Shu-xian;SHI Qi-jun
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page:40-42
Implementation of the 4k Point Radix-16 FFT Module Based on FPGA
SU Yan-peng;ZHANG Han-fu;HAN Lei
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page:8-11
A New Design for Peak-power BIST
LIU Jian-jun;LIU Wei;KANG Yue-ming
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page:4-7,33
Analysis and Research Results of Wafer Probing on Abnormal Problem
LUO Shi-kai;WANG Hui
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page:1-3
Analysis and Research on Leak Rate Equations,Failure Criteria and Internal Gas Concentration(1)
WANG Geng-lin;WANG Li-yan;DONG Li-jun
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page:34-39
Negative-bias Temperature Instability Cure by Process Optimization
REN Jia-dong;WANG Hui;LU Feng
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page:30-33
Analysis of Plasma Damage-induced EEPROM Failures
XIAO Chun-ye;XU Zheng
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page:26-29
Study on Integrating CMOS Compatible High-voltage MOSFETs in a 0.5μm Process
LIU Yun;ZHAO Wen-bin
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page:22-25
The Serial Commucation Design of TMS320F240 DSP Controller
XU Xin-yu;ZHANG Meng-hua
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page:19-21,29
Charge Pump Design for PLL Synthesizer
XUE Hong;LI Zhi-qun;WANG Zhi-gong
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page:15-18
The Design of Wallace Tree by Using a Structure of Modified Mixed Compression
SHAO Lei;ZHANG Shu-dan;YU Zong-guang
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page:12-14,18