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Electronic Product Reliability and Environmental Testing
1672-5468
2016 Issue 6
Estimation of CMOS Digital IC Pin Capacitance
Li Xing-hong;,ZHAO Jun-ping;,ZHAO Yu-jiao;,LIU Li-xin;
..............page:1-6
xin xi dong tai
..............page:6,10,21,40,44,58,62,66-67,后插1-后插2
Research on Information Security Risk Assessment of Industrial Control System
TAO Zhi-jian;,YAO Ri-huang;
..............page:15-21
Research on the Degradation of Leakage Current of AlGaN/GaN HEMT
PENG Zhi-nong;,HU Zhi-fu;
..............page:22-25
The Application of Failure Analysis in the Reliability Improvement of Smart Meter
HE Sheng-zong;,WU Hui-wei;
..............page:26-30
Failure Cases Analysis of PCB Caused by Process Accessories
WANG Xin-juan;,YANG Yong-xing;
..............page:31-35
Research on the Evaluation Method of the Fungus Resistance of the Wires and Cables for Space Station Application
SUN Jia-jia;,ZHANG Yan-wei;,WANG Zhi-bin;,GONG Xin;
..............page:36-40
BIT Design Scheme for Airborne Satellite Communication Equipment
NAN Shu-jun;,XU Wei;
..............page:45-48
Thermal Design Optimization for the Aircraft Cabin of an Unmanned Helicopter
TANG Jun-jun;,WANG Ke-xuan;,ZHENG He-fei;,LIU Da;,XU Yan-nan;,JIANG Nian-zhao;
..............page:49-52
The Reliability and Safty Design Measures of Weapon System
WEI Xuan-ping;,HOU Fang-yong;,WU Bo-feng;,FAN Pu-tao;
..............page:59-62