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Electronic Product Reliability and Environmental Testing
1672-5468
2013 Issue 4
Analysis on Interlaboratory Comparisons of Determination of Halogen in PA Plastics
YANG Yong-xing;YANG Wen-jing
..............
page:18-22
A Test Method to Evaluate the Contaminant Resistant Ability of PCB
ZHU Jian-hua;ZHANG Ying-lan
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page:1-6
Influence of Lead-Free on the Reliability of Electronic Products
PANG Fu-li;ZHOU Jun-lian
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page:55-58
Full Parameter Testing Technology of GMH92 LV 18 on Verigy 93000
WANG Yong;LUO Hong-wei;CAI Zhi-gang
..............
page:68-71
xin xi dong tai
..............
page:6,10,13,17,22,26,49,54,58,63,67,71,80,85-87,后插1-
Analysis on Derating Criteria for Electrical, Electronic and Electromechanical Parts
ZHANG Hao-dong
..............
page:64-67
Airborne Phased Array Radar Software Reliability Testing Environment Construction
YUN Lei
..............
page:45-49
Evaluation Methods for Information System Software
XU Si-yan
..............
page:41-44
Bayes Estimation of Reliability Index of Accelerated Life Test with Zero Failure Data
CHEN Bo;WANG Xiao-qiang;DENG Chuan-jin
..............
page:77-80
Failure Analysis and Control Method of Photosensitive Transistor with Higher Leak Current
BO Peng;ZHANG Wei;MENG Meng
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page:11-13
Factor Analysis on Long-Term Energy Saving of Room Air Conditioner
CHEN Jun;SUN Xiao-yun;ZHANG Zhi-gang;XIAO Shi-man;ZOU Wei
..............
page:7-10
Motion Analysis of 4-DOF Robot Based on Lagrange Equation
SU Meng
..............
page:36-40
Analysis on Uncertainty of Testing and Measuring Camshaft Assembly Press-Fitting Angle
LU Xiu-hong;GUO Ying-ying;LIU Jing-yu
..............
page:72-76
Software Framework Design of Weapon System Testability Modeling and Analysis
FANG Zi-hao
..............
page:27-30
Analysis on DC Aging Power Informatization Model based on CAN Bus
HU Hong-jiang;SU Meng
..............
page:23-26
Evaluation on Uncertainty of Measuring Lead in the Tin Solder by ICP-OES
YANG Wen-jing
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page:14-17
Technical Analysis on Deployment of Six Sigma Quality Box in Cloud Platform
GE Zhi-jun;PAN Yong;GUO Ai-min
..............
page:31-35
Review on Dynamic Fault Tree Analysis
DUAN Ling-hao;GUO Ai-min;PAN Yong
..............
page:59-63
Reliability Technology Development of Smart Electricity Meter
ZHANG Wei-xin;XIE Yan;YAN Jing-jing;LI Bei;WANG You-liang
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page:50-54
Design of Loop Filter Used in Chip Testing
TANG Rui
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page:81-84