Electronic Product Reliability and Environmental Testing 2009 Issue z1 dian zi chan pin wen du shi yan fang zhen ji shu tan tao

dian zi chan pin wen du shi yan fang zhen ji shu tan tao
liu jun ; yang fang yan

..............page:268-272

shu ju chuan shu zhong duan she bei de ke kao xing fen xi ji she ji
wu hui lun

..............page:177-185

yan chang dao dan zhu cun qi ti gao zhu cun ke kao du de ji ben tu jing
liu xue feng ; li xin jun ; zhang shi nian ; song ya nan ; lu zu jian

..............page:186-189

jia su zhu cun shou ming shi yan you hua she ji zong shu
song ya nan ; li xin jun ; liu xue feng ; zhang shi nian ; wang shou zhen

..............page:189-192

shen du hei he xing she bei zhu cun shou ming ping gu fang fa yan jiu
cheng de bin ; zhang zi hua

..............page:193-197

fang jian kong diao qi ke kao xing shi yan fang fa
shi zhong ; gao jun ; zuo zhi li

..............page:197-201

qian lun ke kao xing gong cheng fa zhan de ruo gan fang xiang
li xiang chen ; peng dao yong ; qi jun chen ; zhu san ke ; zhang de cai

..............page:142-146

Life Design and Management of Electric Products
hu lin zhong

..............page:147-151

xi tong yan zhi jie duan ke kao xing ping gu ji shu tan tao
sun yu yu

..............page:152-154

lun gu ti huo jian fa dong ji rou xing jie tou zhu cun ke kao du
peng dao yong ; zhang guo bin ; chen yan ni ; zhu san ke

..............page:129-131

di zao sheng fang da qi lna de ce shi xi tong she ji fen xi
chen guang cong

..............page:138-142

Research on High-temperature-resistance (140℃) Electrolytic Capacitors
wei zong yuan ; wang jin

..............page:132-138

ke kao xing yu ji he fen pei yan jiu
peng dao yong ; zhang guo bin ; chen yan ni ; wang zhao ying

..............page:174-177

jun yong ruan jian zhi liang yu ke kao xing kong zhi guan li fang fa qian xi
shen yun qiu ; liu xue feng ; yin wei gang ; song ya nan ; li xiao

..............page:241-246

jun yong ruan jian jia gou she ji ji shu qian xi
yin wei gang ; zhang tian ; li xiao ; yi bin

..............page:238-241

The Research on Reliability of the Military Software
yang yan ni ; peng dao yong ; zhang shi nian ; yin wei gang ; zhang guo bin

..............page:228-230

A Method to Improve the Software Reliability Prediction Quality
yang qi guo

..............page:231-237

qian tan dc-dc dian yuan mo kuai chang yong de bao hu ji shu
zhang ji hui

..............page:225-228

ke kao xing ping gu zhong zhi shu xing shu ju xiang cheng bai xing shu ju de zhe he
zhu san ke ; li xiang chen ; qi jun chen ; peng dao yong

..............page:167-169

dian zi zhuang bei wei xiu xing fen xi yu ping ding
wang hua ; zhang shu long ; gao feng ; gao peng ; liu shan kun

..............page:163-166

ji zhong chang jian rong yu fang shi de ying yong xiao guo tan tao
li xin jun ; liu xue feng ; song ya nan ; wang shou zhen

..............page:158-162

Recent Development in Reliability Physics and Failure Analysis

..............page:1-4

npn shuang ji jing ti guan de eldrs xiao ying ji tui huo xing wei
lu zuo ; ren di yuan ; zheng yu zhan ; wang yi yuan ; guo qi ; yu xue feng ; he cheng fa

..............page:90-93

duo xin pian zu jian (mcm) ke kao xing ji shu tan tao
wang yan zhi ; jia ying

..............page:86-90

Failure Analysis for an abnormal Delamination of PCBA
luo dao jun ; wang yang

..............page:94-98

dian zi she bei ke kao xing she ji zhong qi jian de shi xiao ping gu
shi rong

..............page:155-158

jun shi xin xi xi tong de ke kao xing he an quan xing
wang xiao feng ; zhang ze min ; liu zuo lin ; ding wei heng

..............page:170-174

fib de gong zuo yuan li ji qi ying yong
zhang xiao wen ; lin xiao ling ; chen zuo

..............page:4-10

A study of the modified Arrhenius acceleration factor in acceleration life test
li jin ; li chuan ri

..............page:38-42

dian zi yuan qi jian de shi xiao mo xing yu ke kao xing shi yan fang fa qian xi
wang zhi gang ; dai bai lin ; zhang bi chao

..............page:33-38

Delayer technology applying in failure analysis
chen zuo ; li shao ping

..............page:10-14

ji yu gai lv xuan ze mo xing de duo shi xiao mo shi ke kao xing jian mo fen xi
yi fan fan ; zhang chun hua ; wang ya shun

..............page:43-47

dian zi yuan qi jian kuai su ping jia xin fang fa de ying yong yan jiu
li zhi guo ; guo chun sheng ; lv chang zhi

..............page:47-57

xin xi xi tong ying yong ruan jian zhi liang kong zhi
wang hua ; shi bai shan ; zhang hong

..............page:250-253

shou ji ying yong ruan jian an quan xing ce shi
huang mao sheng ; chen ping

..............page:254-259

qian tan ruan jian de zhi liang bao zheng
qu li xin

..............page:260-262

huan jing shi yan zhong ning lu wen ti qian xi
guo lin

..............page:263-265

mo xing shi yan zai dao dan shui xia fa she zhong de yi yi
hou hai mei ; ning yun zuo ; fan xiao hong

..............page:265-267

ruan jian ke kao xing ping gu yu ce shi fang fa yan jiu
ning yun zuo ; hou hai mei ; fan xiao hong

..............page:247-249

hang tian chan pin chang qi zhu cun shi xiao fen xi yan jiu
qi jun chen ; li xin jun ; zhu san ke ; peng dao yong ; li xiang chen

..............page:61-66

guo chan ban dao ti qi jian chang qi zhu cun shi yan yan jiu
gao zhao feng ; gao jin huan ; xu li sheng

..............page:66-69

guo chan jing ti guan de chang qi zhu cun ke kao xing
lv chang zhi ; zhang xiao ling ; xie xue song ; cheng yao hai ; wang dong feng ; li zhi guo

..............page:69-72

The Study on the Long-Term Storage Life of Electronic Components by Accelerated test
zhang xiao ling ; xie xue song ; lv chang zhi ; li zhi guo

..............page:72-75

ji yu fang zhen de dian lu gu zhang mo shi shi bie yan jiu
lin dan long ; sun yu feng ; zhao guang yan

..............page:220-224

ji yu pxi zong xian de dian yuan jian ding zhuang zhi she ji yu shi xian
zuo wan ti ; liu ming jun ; yin wei gang

..............page:202-205

ji yu dong tai gu zhang shu de qi che zhi dong xi tong ke kao xing fen xi
hong qiang ; liang liang

..............page:206-212

xian xing dian yuan shi pei qi jie jue eft de gai jin dian lu
zhang hong wei ; zhang xue yuan

..............page:212-213

Road &Bridge Toll System Combining RFID Technology and Security Risk Analysis
li zuo ; yang xiao ming ; zhu jian hong

..............page:214-219

huan yang guan feng jiao kai lie shi xiao ji li ji dui ce yan jiu
zhang guo bin ; liu chun he ; peng dao yong ; zhu san ke ; yang yan ni

..............page:109-113

Analysis failure for electrical properties of threaded coupling
chen quan shou

..............page:114-116

jing dian fang dian min gan du biao zhun de dong xiang he jian yi
wang geng lin ; hong jie ; wu wei gang ; li ya qin

..............page:122-125

The Study of Failure Mechanism of Contact Resisitance Enhacement of Relay Contact
li ji wei ; shi ming zhe ; liu zi lian

..............page:117-121

biao tie yuan qi jian chang jian de shi xiao mo shi ji ji li fen xi
fan shi hai

..............page:57-60

Discussion for Black Pad and Failure Analysis for Related Example
ma li li

..............page:99-102

ti gao neng pu yi ding liang fen xi zhun que du de tan tao
shi ming zhe ; zhang hui ; zhu hui ji

..............page:14-21

shu ju ka jie gou yu jing dian fang hu
zhang xue yuan

..............page:126-128

qian tan pcb ji ben she ji he kang gan rao she ji yao qiu
zhang ji hui

..............page:106-108

Reading the Environmental Pressure of PCB Industry
dong ling ling

..............page:102-105

gao ke kao ying yong de su feng wei dian lu sheng ji shai xuan he jian ding de tan tao
yang shao hua ; lai ping

..............page:76-80

hai zhi pu xi jian lou guo jun biao de xiu gai fang an
wang geng lin ; wang cai yi ; wang li yan ; dong li jun ; li fei

..............page:21-32

gaas qi jian shou ming shi yan ji qi fang fa bi jiao
cui xiao ying

..............page:80-85