1672-5468
2007 Issue 6
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..............page:插1
..............page:3,34,47,66
Factors that Influence Life Test of Capacitors
CHEN Yan;DONG Shi-na;ZHAO Hong-jie
CHEN Yan;DONG Shi-na;ZHAO Hong-jie
..............page:64-66
Some Technical Issues of Sand and Dust Test Equipment
MA Zhi-hong;LI Jin-guo
MA Zhi-hong;LI Jin-guo
..............page:60-63
A New Reliability Allocation Method
LI Chun-ling
LI Chun-ling
..............page:57-59
Reliability Analysis and Studies on Water Tunnel Based on Fault Tree Analysis Method
ZHU Kang-wu;CHEN Wei-zheng;LENG Jian-xing
ZHU Kang-wu;CHEN Wei-zheng;LENG Jian-xing
..............page:51-56
Bayesian Estimation of Step-Stress Accelerated Life Testing of Exponential Distribution
WU Dong;ZHANG Qing;TANG Yin-cai
WU Dong;ZHANG Qing;TANG Yin-cai
..............page:48-50
Signal Detection and MATLAB Simulation in Noise Environment
WEI Xuan-ping;ZHANG Zhou-sheng;YAO Min-li
WEI Xuan-ping;ZHANG Zhou-sheng;YAO Min-li
..............page:45-47
Application of MATLAB in the High-Low Temperature Simulation Test
YUAN Li-feng;ZHAO Zhen-feng
YUAN Li-feng;ZHAO Zhen-feng
..............page:39-44
Thermal Simulation Analysis of Airborne Communication Equipment
JIN Zhi-jun;XUE Cheng-qi;CAO Cun-ming
JIN Zhi-jun;XUE Cheng-qi;CAO Cun-ming
..............page:35-38
The Testing and Burn-in Screening Technology for Power Bare Die
LIU Lin-chun;KONG Xue-dong;HUANG Yun
LIU Lin-chun;KONG Xue-dong;HUANG Yun
..............page:31-34
Typical Use Environmental Conditions, Test Conditions and Failure Mechanisms of High Reliability Electronic Components
CHEN Ying;SUN Bo;XIE Jing-song;KANG Rui
CHEN Ying;SUN Bo;XIE Jing-song;KANG Rui
..............page:23-30
Failure Modes and Mechanisms of GaAs PHEMTs
XU Yan;HUANG Yun;DENG Wen-ji
XU Yan;HUANG Yun;DENG Wen-ji
..............page:19-22
Research on Lifetime Models of Semiconductor Devices Based on Failure Mechanism
ZHAO Xia;WU Jin;YAO Jian-nan
ZHAO Xia;WU Jin;YAO Jian-nan
..............page:15-18
..............page:11-14
Failure Analysis of Plastic Encapsulated GaAs MMICs
LI Ping;HUANG Yun;ZHENG Ting-gui;SHI Ming-zhe
LI Ping;HUANG Yun;ZHENG Ting-gui;SHI Ming-zhe
..............page:8-10
Study on the Gain Degradation Mechanism of the Silicon Microwave Pulsed Power Transistor
LIAO Chao;LAI Ping;LI Bin;CUI Xiao-ying
LIAO Chao;LAI Ping;LI Bin;CUI Xiao-ying
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