Electronic Product Reliability and Environmental Testing 2007 Issue 1 chuang xin zhu jiu hui huang su zhou dong ling zhen dong shi yan yi qi you xian gong si chuan qi de chuang xin shi

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Electronic Product Reliability and Environmental Testing
1672-5468
2007 Issue 1

chuang xin zhu jiu hui huang su zhou dong ling zhen dong shi yan yi qi you xian gong si chuan qi de chuang xin shi

..............page:66-67

The Balance Control of Electrodynamic Shaker's Armature
CHEN Jun;WU Guo-xiong;CAI Ai-jun

..............page:68-70

Design of Radiation Emission for EMC in Digital Power Amplifier
YANG Jing-fa;CHEN Jun

..............page:71-73

Application of Simulation to Product Research and Design
YE Teng-bo;CHEN Jun

..............page:74-76

Repair of Defective Digital Electronic Equipment
LI Zheng

..............page:63-65

Design of Short-wave Digitized Transmitter Control Unit
LI Ming;CHI Rong-nuan;DONG Qiao-ling

..............page:58-62

Research and Implementation of Online E-business Negotiations System Based on SVG
HONG Bo;LI Ji-yun

..............page:54-57

Approximate Caculation of Disk Access Time
WU Cui-juan;LI Dong

..............page:51-53

Discussion about Measuring Errors and Data Processing of Electronic Appliances
WANG Jing;LIU Yu-xia;MA Bo;WANG Li

..............page:46-50

Packaging Technology for Multichip Module Using New Type Multilayer Substrate
LI Ping;HE Xiao-qi

..............page:42-45

Military Equipment Operational Readiness and Analysis on Affecting Factors
LI Yuan-sheng;SHI He-ping

..............page:38-41

Research of Set-Top-Box for Digital Cable TV
YANG Xiao-ming

..............page:34-37

Reliability Analysis of Electronic System Quality in Innovation Laboratory
ZHENG Fa-tai;YE Jian-bo;WENG Zheng-guo

..............page:31-33

A New Study of Fuzzy Fault Tree Analysis
LI Xin

..............page:27-30

Full Parameter-based Reliability Function
GAO Xiao-jun;GAO Hui-yuan

..............page:25-26

Treatment of Outliers of Test Data in Product Quality Inspection
ZHANG Zhen-yan

..............page:22-24

Estimating MTBF of the Equipment in Fixed Time Truncated Test When the Malfunction Factor r = 0
LIU Wei;YUAN Xin;QIAO Ming-feng

..............page:19-21

Effect of Storage Environments on the Capacitance Variability of High Voltage Pulse Capacitors
YE Hai-fu;YAO Yong-he;YU Cheng-long

..............page:15-18

Communication System EMC
WANG Ping;LU Lei;WANG Xian-gang

..............page:11-14

Cause Analysis of EFT/B Test Failure and Countermeasures
ZHU Wen-li

..............page:5-10

Research of Temperature Stepped Stress Accelerated Life Testing
LI Jian;WANG Jin-hua;LU Pei-yong

..............page:1-4