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Electronic Product Reliability and Environmental Testing
1672-5468
2005 Issue 6
Quality control and reliability requirements for imported components
PENG Su-e;ZHENG Li-xiang
..............page:63-67
Reliability allocation method for complex system using AHP
PENG Bao-hua;ZHAO Jian-yin;SUN Quan
..............page:58-62
PSPICE aided design of SRAM 6T storage cell
ZHANG Xiao-bo;JIAO Hui-fang;JIA Xin-zhang
..............page:54-57
Application of vibration test
LU Fan;WANG Ge-wen;JU Hua-yang
..............page:40-43
Environmental stress screening process and effectiveness estimation
LU Pei-yong;HE Hong-ping
..............page:36-39
The hot electron degradation of GaAs MESFET
zhu zuo rong ; huang yun ; huang mei qian ; niu li rong
..............page:32-35
Failure mechanisms analysis of tube socket
LI Shao-ping
..............page:29-31
Total dose effect of nMOSFET under low-energy X-ray irradiation
EN Yun-fei;LUO Hong-wei
..............page:25-28
Application of Matlab to the definition of reliability distribution model
WEI Xian-ping;ZHANG Ji-chuang;WANG Xiao-lin
..............page:22-24
The Monte Carlo simulation of fire detector reliability
SONG Jiu-zhuang;LI Shu-gang;LI Xiao-bin;YUE Hai-ling
..............page:19-21
Study on Arrhenius relationship
LIN Zhen;JIANG Tong-min;CHENG Yong-sheng;HU Bin
..............page:12-14