Electronic Product Reliability and Environmental Testing 2005 Issue 4 zhong guo jiang zai gong gong jian zhu she ji zhong tui xing jie neng biao zhun

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Electronic Product Reliability and Environmental Testing
1672-5468
2005 Issue 4

zhong guo jiang zai gong gong jian zhu she ji zhong tui xing jie neng biao zhun

..............page:41

na mi xin pian shi dai lai lin

..............page:50

gu hua you wang " yue zu " bian " ri zu "

..............page:59

yi hai shui wei zhu yao yuan liao ren zao tai yang fa dian gou yong bai yi nian

..............page:67

hua wei zhong xing shu zi ji qun jiang jin jun xing ye biao zhun

..............page:71

rohs zhuan ti ( si )

..............page:前插1

"dian zi yuan jian " xiang guan biao zhun ( er )

..............page:38

shou ji ke yong yu mi zao

..............page:35

heng liang ip zhi liang de xin ban biao zhun

..............page:33

pspice jian jie

..............page:25

zhong dong -- zhong guo jia dian hai wai kuo zhang xin mu biao

..............page:21

mei guo yu e zhi wapi zhong guo biao zhun zai mei guo tui xing

..............page:13

jiang dian nao zhi ru ren ti nei de huan xiang

..............page:9

The design of exam system based on Internet
XU Yong-zhi

..............page:68-71

The research of smart antenna based on Software Definition Radio
LIU Chuan-run

..............page:64-67

Application and importance of EDA software in communication equipment
LI Guan-ce;LU Fan

..............page:60-63

Environmental stress screening overview and new approach
LIU Hang-sheng

..............page:55-59

Exploring ISO 9001:2000 and software engineering synergy
CHEN Wei;ZHONG Lun-yan;WANG Wei-dong

..............page:51-54

The challenges and corrective actions of destructive physical analysis
ZHANG Yan-wei

..............page:48-50

EMC technique of electromechanical devices
WANG Ya-ping

..............page:45-47

Sources and suppression of electromagnetic interference from switching-mode power supply
NIU Bai-qi

..............page:42-44

Open issues due to misplace bond
XIE Xiao-bin

..............page:39-41

Functional failure of Hall device process defect
XU Ai-bin

..............page:36-38

Normalization of different batch samples
SHANG Shao-huan

..............page:34-35

The research of corrosion resistance for ICs
DU Ying;GUAN Guang-bao

..............page:30-33

Common model fault analysis
ZHANG Tong-hao;SUN You-chao

..............page:26-29

Research and simulation of surge signal forming in a analog circuit
RU Dong-sheng;YAN Jie-yu

..............page:22-25

Application of a Bayes-based reliability assessment method to communication equipment
ZHANG Jin-fu;JIN Zheng-yu;ZHANG Jian-tao

..............page:18-21

The management and strategy of third-party software testing
CHEN Zeng-ji;HUANG Mao-sheng

..............page:14-17

Software acceptance criteria
BIN Jian-wei

..............page:10-13

Analysis of the memory errors of software and prevention
HUANG Mao-sheng

..............page:6-9

Integrated circuit failure analysis technology
FEI Qing-yu

..............page:1-5