Electronic Product Reliability and Environmental Testing 2004 Issue 6 suo yue biao

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Electronic Product Reliability and Environmental Testing
1672-5468
2004 Issue 6

suo yue biao

..............page:84

wei lai ban dao ti ye de wu da qu shi

..............page:78

3c ccee jian jie

..............page:75

emc shu yu

..............page:67

ibm suo ni dong zhi gong bu bao han power jia gou he xie chu li qi de duo nei he xin pian

..............page:52

suo you de shu ou chan pin du xu yao ce ma ?

..............page:30

rui dian systecon gong si zai jing tui jie zong he bao zhang fang zhen ruan jian

..............page:26

ou zhou shi chang yao qiu bao zhuang shang xu yin you hui shou biao zhi

..............page:22

The discussion of grid security problem
tang hai hua

..............page:79-82

The realization of hardware descriptive language in electronic circuit design
zuo kai yi

..............page:76-78

Analysis and comparison of classification algorithms
chen zuo zuo ; peng xin guang

..............page:72-75

SI simulation analysis based on IBIS Model
fang guo hua ; liu guang bin ; yu zhi yong

..............page:68-71

The design and implementation of information platform software for electronic product design and resource supportability
yang pei liang

..............page:61-67

Measurement of nonlinear inductance
wang li ; zhang zhe ; zhang dong dong ; yin zhao tai

..............page:56-60

Analysis of high-voltage divider's breakdown fault mode
du tao

..............page:53-55

An investigation of high temperature and constant current electromigration reliability assessment technique
wang tao ; li bin ; luo hong wei

..............page:49-52

Research on the Shear strength test criterion for passive components in hybrid circuits
zhang yan wei

..............page:46-48

Environmental worthiness analysis of the jointing waveguide in moist heat climate
yang wan jun ; xiao min

..............page:42-45

Integrated environmental test of temperature, humidity and vibration
zhang wei

..............page:38-41

Edge detecting in denary image based on mathematical morphology
li gang ; li yan

..............page:35-37

Maximum likelihood estimation in the simple step stress accelerated life testing based on the grouped data
li yan bing ; fei he liang

..............page:31-34

Researching of measures of performance reliability
hu chao bin

..............page:27-30

The reliability analysis of helicopter assembly security in appointed time
zhang hong bin ; huang yan fang

..............page:23-26

Study on spare availability and optimization model
zhang jian jun ; li shu fang ; zhang tao ; guo bo ; gao da hua

..............page:18-22

Study on the policy for self-repair of smart materials and structures
yang ming ; liang da kai ; pan xiao wen

..............page:14-17

Design for dependability of military electronic equipment
sheng jian you ; tang jian guo

..............page:8-13

Quality and reliability in the weapon's development
wang xi ji ; wang peng

..............page:1-7