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Electronic Product Reliability and Environmental Testing
1672-5468
2004 Issue 2
Improving of Conditional Median Algorithm for Estimating Storage Failure Rate
hu bin ; lin zhen ; zhu liang
..............page:26-28
The Evaluation of the 6 σ Design Level
jia xin zhang ; wang shao xi ; pu jian bin
..............page:22-25
Dynamical Modal Analysis of TWT Grided Electron Gun
song fang fang ; he xiao zuo ; tang kai ; yang xu gui ; lv xiang ying
..............page:17-21
High Temperature and Constant Electric Field TDDB Test of Thin Gate Oxide
wang tao ; li bin ; luo hong wei
..............page:10-13
Aluminium Film EM Mechanism Study under Bidirectional Current Stressing
zhang xiao wen ; en yun fei
..............page:6-9
The Challenges and Development of the Design Technique for SOC
jiao hui fang ; jia xin zhang
..............page:55-59
Method of Video Image Process Based on SDH Network
zuo zhen ; huang zhi ping ; lu qin
..............page:51-54
Application of the Reliability Assessment Software to the Manned Aerospace Engineering
pan yong ; guo ai min ; cheng zhuo
..............page:47-50
Research and Design of LCR Impedance Standards
xie shao feng ; dai da shan
..............page:43-46
Residual Gas Analysis of Hermetic Device
wu wen zhang
..............page:34-37
Protection of Outdoor LCD from UV-rays
wu yong jun ; zhan qian xian
..............page:29-33