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Electronic Product Reliability and Environmental Testing
1672-5468
2003 Issue 1
The Application of Petri Nets in the System Reliability Analysis
zhang tao ; wu xiao yue ; tan yue jin
..............page:60-65
Reliability Tests on Key Components of Nuclear Logging Tools
ren xiao rong
..............page:55-59
Reliability Design of Micro- Computer Measure and Control System
yang yin gang ; yang guang zuo ; zhu wen xian
..............page:1-5
Reliability Design for a Data Telecommunication Product
cai yun zhi
..............page:6-12
Effect of Contamination in Circait on Storage Failure of Missile Fusee System
wang yu xiang ; wang guo hua
..............page:16-18
Strength the Control of Technological Quality to Satisfy the Users
huang li ; song feng ling ; li xin rui ; liu xiao xia
..............page:22-23
Sneak Circuit Analysis in Reliability Engineering
zhou tao ; hu chang hua ; xia qi bing
..............page:24-28
Application of Raeconfiguration Technology in Rangefinder System
chen wan hua ; pan hong bing ; wang hou xiang
..............page:29-32
Software Product Assurance: Systematical Planning and Phased Missions
gong bo ; liu zheng gao
..............page:33-39
Benchmark Testing for PLD EDA Software
su peng yi
..............page:40-42
Analysis of Reliability Bounds for Several Type Systems
wang jin cai ; yang zuo song
..............page:43-45
Study on the Stress Profile in RET
chen xun ; zhu wen xian ; tao jun yong
..............page:46-50
Improvement of Reliability Growth of Electronic Components Using 6 σ Management Technology
jia zuo peng ; qi wei ; zuo jin song ; lin de jian
..............page:51-54