Electronic Product Reliability and Environmental Testing 2001 Issue 2 1998 nian ieee guo ji ke kao xing wu li nian hui lun wen zhai yao (1)

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Electronic Product Reliability and Environmental Testing
1672-5468
2001 Issue 2

1998 nian ieee guo ji ke kao xing wu li nian hui lun wen zhai yao (1)

..............page:45-48

Application and Advances of Reliability Technology in VLSI
kong xue dong ; en yun fei

..............page:2-5

Reliability Prediction and Allocation of a Certain Data Communication Product
lei xin

..............page:6-9

Screening the Level of Repair Decision and Application Example
zhang yi fang ; shen chun lin

..............page:10-15

Design Technologies for ESD Protection of CMOS IC's
yu zong guang

..............page:16-21

CTR Degradation Mechanism of Photoelectronic Coupler and its Control
xu ai bin ; li shao ping ; ou ye fang ; zheng ting gui

..............page:22-24

Analysis and Solution of the Reliability Difference Between Lab and Field Usage for Airborne Equipment
tian kai rang

..............page:25-29

Quality Control and Reliability Manegement of Military Communication Equipment
wang xu

..............page:25-29

Brief Review on Testing and Certification of ODS Alternative Technologies
deng guo hua

..............page:34-39

Applications in Hi-reliability Program of Integrated Circuit Upgrade Test
jiang li dong ; xia zuo

..............page:40-44