INVESTIGATION OF CHEMICAL BOND PROPERITIES AND MOSSBAUER SPECTROSCOPY IN EuBa2Cu3O7
Gao Fa-ming;Li Dong-chun;Zhang Si-yuan

..............page:468-473

SUPER-LOW FREQUENCY AC LOSSES OF HTS Bi2223/Ag TAPE MEASURED BY MAGNETIZATION METHOD
Hu Li-fa;Zhou Lian;Li Cheng-shan;Ji Ping;Teng Xin-kang;Wang Jin-xing;Zhang Ping-xiang;Liu Xiang-hong

..............page:462-467

SELF-FIELD LOSSES AND AC VOLTAGE-CURRENT CHARACTERISTICS IN MULTIFILAMENTARY Bi2223/Ag TAPES WITH DIFFERENT CRITICAL CURRENT
Hu Li-fa;Zhou lian;Wang Jin-xing;Yang Wan-ming;Li Cheng-shan;Zhang Pin-xiang

..............page:454-461

A STUDY OF INFLUENCE OF PLASMA FLUORINATION ON YBCO THIN FILM
Z.L.Fu;D.Z.Gu;L. Liu;E.H.Zhao;L. Kang;Y.J.Feng;Z.M.Ji;X.S.Wang;X.B.Yin;S.Z.Yang

..............page:449-453

THE STRUCTURE, THERMAL AND MAGNETO-TRANSPORT PROPERTIES OF La1-xNaxMnOz CERAMICS
Li Zhi-qing;Jiang En-yong;Qu Yuan-fang;Zhang De-xian;Hou Deng-lu;Li Wen-cheng

..............page:443-448

EFFECT OF CROSS-SECTION SHAPE OF Bi-2223 FILAMENT ON Jc IN Bi-2223/Ag TAPE
Xie Xu;Luo Kang;Luo Zhi-quan;Gao Zheng-xiang;Duan Zhen-zhong;Zhou Lian;Zhang Ping-xiang;Zheng Hui-ling;Wu Xiao-zu;Lin Wei;Deng Hua;Hua Pei-wen

..............page:439-442

NUMERICAL SIMULATION ON THE EFFECT OF SWEEPING RATE OF APPLIED CURRENT ON THE CRITICAL CURRENT
Y.H. Zhang;Z. Xu;S.Y.Ding

..............page:433-438

INVESTIGATION ON THE GROWTH AND ELECTRICAL PROPERTIES OF Pb(Zr0.6Ti0.4)O3/YBa2Cu3O7-x BILAYER STRUCTURE
D.Z. Gu;Z.L. Fu;L. Liu;Q.G. Liu;Y.J. Feng;L. Kang;Z.M. Ji;S.Z. Yang;Z.G. Zhang;Y.N. Wang

..............page:428-432

THE INFLUENCE OF THE SUBSTRATE ON PHOTOLUMINESCENCE (PL) SPECTRUM OF YBa2Cu3O7-δ CRYSTAL FILMS
Du Ying-lei;Wu Bai-mei;Lee Ki-hwan;Kim Young-you;Wang Xiao-ping

..............page:423-427

LARGE MAGNETIC ENTROPY CHANGE OF La2/3Ca1/3MnO3
Liu Ning;Sun Yong

..............page:418-422

π-ELECTRONS AND GLIDE PLANE SYMMETRY IN CONJUGATED POLYMERS
Zhou Xiang;Hu Cheng-zheng

..............page:411-417

RESISTANCE REENTRANCE IN LAYERED SUPERCONDUCTOR 2H-NbSe2
B. Zhang;M. L. Tian;Y. H. Zhang

..............page:401-410