Criteria for versatile GaN MOVPE tool:high growth rate GaN by atmospheric pressure growth
Koh Matsumoto~;Kazutada Ikenaga~2;Jun Yamamoto~1;Kazuki Naito~2;Yoshiki Yano~2; Akinori Ubukata~2;Hiroki Tokunaga~2;Tadanobu Arimura~2;Katsuaki Cho~2;Toshiya Tabuchi~2; Akira Yamaguchi~3;Yasuhiro Harada~1;Yuzaburo Ban~1;and Kousuke Uchiyama~1 1 TN-EMC Ltd;2008-2 Wada;Tama;Tokyo 206-0001;Japan 2 Business Strategy Planning div.Electronics Group;TAIYO NIPPON SANSO Corporation;10 Okubo; Tsukuba 300-2611;Japan 3 Compound-semiconductor Division;TAIYO NIPPON SANSO Corp.;6-2 Kojimacho;Kawasaki-shi;210-0861;Japan
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Complementary charge islands structure for a high voltage device of partial-SOI
Wu Lijuan~ Hu Shengdong;Zhang Bo;and Li Zhaoji 1 State Key Laboratory of Electronic Thin Films and Integrated Devices;University of Electronic Science and Technology of China;Chengdu 610054;China 2 College of Communication Engineering;Chengdu University of Information Technology;Chengdu 610225;China 3 College of Communication Engineering;Chongqing University;Chongqing 400044;China
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Degradation of light emitting diodes:a proposed methodology
Sau Koh~;Willem Van Driel~;and G.Q.Zhang~1 1 Delft Institute of Microsystems and Nanoelectronics;Delft University of Technology;Mekelweg 6; 2628CD Delft;Netherlands 2 Materials Innovation Institute;Mekelweg 2;2628 CD;Delft;Netherlands 3 Philips Lighting;LightLabs;NL-5611BD;Eindhoven;Netherlands
..............page:41-44
Reliability test and failure analysis of high power LED packages
Chen Zhaohui~1;Zhang Qin~3;Wang Kai~3;Luo Xiaobing and Liu Sheng Research Institute of Micro/Nano Science and Technology Shanghai Jiao Tong University Shanghai 200240;China Wuhan National Laboratory for Optoelectronics Huazhong University of Science & Technology Wuhan 430074;China Institute of Microsystems;School of Mechanical Science and Engineering;Huazhong University of Science & Technology Wuhan 430074;China
..............page:53-56
A multivariate process capability index model system
Wang Shaoxi~ and Wang Danghui 1 College of Software and Microelectronics;Northwestern Polytechnical University;Xi’an 710072;China 2 School of Computer Science and Technology;Northwestern Polytechnical University;Xi’an 710072;China
..............page:116-122
Fluorescent SiC and its application to white light-emitting diodes
Satoshi Kamiyama~;Motoaki Iwaya~1;Tetsuya Takeuchi~1;Isamu Akasaki~1; Mikael Syvjrvi~2;and Rositza Yakimova~2 1 Department of Materials Science and Engineering;Meijo University;1-501 Shiogamaguchi;Tenpaku-ku; Nagoya 468-8502;Japan 2 Department of Physics;Chemistry and Biology;Linkping University;S581 83 Linkping;Sweden
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A review of passive thermal management of LED module
Ye Huaiyu~;Sau Koh~;Henk van Zeijl~1;A.W.J.Gielen~3; and Zhang Guoqi 1 Delft Institute of Microsystems and Nanoelectronics;Delft University of Technology;Mekelweg 6;2628CD; Delft;Netherlands 2 Materials Innovation Institute;Mekelweg 2;2628 CD;Delft;Netherlands 3 Netherlands Organization for Applied Scientific Research;De Rondom 1;5612 AP;Eindhoven;Netherlands
..............page:57-60