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Chinese Journal of Semiconductors
0253-4177
2009 Issue 12
TaN wet etch for application in dual-metal-gate integration technology
Li Yongliang and Xu Qiuxia
..............page:133-136
Simulation for signal charge transfer of charge coupled devices
Wang Zujun 1;2;Liu Yinong 1;Chen Wei 2;Tang Benqi 2;Xiao Zhigang 2;Huang Shaoyan2;Liu Minbo 2;and Zhang Yong 2
..............page:42-49
A 1-V 60-μW 85-dB dynamic range continuous-time third-order sigma-delta modulator
Li Yuanwen 1;Qi Da 1;Dong Yifeng 1;Xu Jun 1;and Ren Junyan1;2
..............page:118-122
A symbolically defined InP double heterojunction bipolar transistor large-signal model
Cao Yuxiong;Jin Zhi;Ge Ji;Su Yongbo;and Liu Xinyu
..............page:37-41
A 3.1-4.8GHz transmitter with a high frequency divider in 0.18μm CMOS for OFDM-UWB
Zheng Renliang;Ren Junyan;Li Wei and Li Ning
..............page:69-76
A constant-g_m and high-slew-rate operational amplifier for an LCD driver
Lai Xinquan;Li Xinlin;Ye Qiang;Yuan Bing;and Li Xianrui
..............page:64-68
A multi-mode low ripple charge pump with active regulation
Ye Qiang;Lai Xinquan;Xu Luping Wang Hui;Zeng Huali;and Chen Fuji
..............page:87-92
Low-power CMOS fully-folding ADC with a mixed-averaging distributed T/H circuit
Liu Zhen;Jia Song;Wang Yuan;Ji Lijiu;and Zhang Xing
..............page:128-132
Confinement of gold quantum dot arrays inside ordered mesoporous silica thin film
Chi Yaqing1; Zhong Haiqin1; Zhang Xueao2; Fang Liang1; and Chang Shengli2
..............page:1-4
A bootstrapped switch employing a new clock feed-through compensation technique
Wu Xiaofeng 1;2;Liu Hongxia 1;Su Li3;Hao Yue 1;Li Di 1;and Hu Shigang 1 Ltd;Shanghai 200070;China)
..............page:93-102
Stress,structural and electrical properties of Si-doped GaN film grown by MOCVD
Xu Zhihao;Zhang Jincheng;Duan Huantao;Zhang Zhongfen;Zhu Qingwei;Xu Hao and Hao Yue
..............page:13-17
ESR characters of intrinsic defects in epitaxial semi-insulating 4H-SiC illuminated by Xe light
Cheng Ping;Zhang Yuming;Zhang Yimen;and Guo Hui
..............page:9-12
Improvements to the extraction of an AlGaN/GaN HEMT small-signal model
Pu Yan;Pang Lei;Wang Liang;Chen Xiaojuan;Li Chengzhan;and Liu Xinyu
..............page:25-29
Clear correspondence between gated-diode R–G current and performance degradation of SOI n-MOSFETs after F-N stress tests
He Jin1;2;Ma Chenyue2;Wang Hao2;Chen Xu2;Zhang Chenfei2;Lin Xinnan1;and Zhang Xing2
..............page:30-32
GaN/metal/Si heterostructure fabricated by metal bonding and laser lift-off
Zhang Xiaoying 1;Ruan Yujiao 2;Chen Songyan2;and Li Cheng2
..............page:5-8
Impact of UV/ozone surface treatment on AlGaN/GaN HEMTs
Yuan Tingting;Liu Xinyu;Zheng Yingkui;Li Chengzhan;Wei Ke;and Liu Guoguo
..............page:18-20
An improved HCI degradation model for a VLSI MOSFET
Tang Yi1;Wan Xinggong1;Gu Xiang2;Wang Wenyuan2; Zhang Huirui2;and Liu Yuwei2
..............page:33-36
A four-channel microelectronic system for neural signal regeneration
Xie Shushan 1;Wang Zhigong 1;L  Xiaoying 2;Li Wenyuan 1;and Pan Haixian 2
..............page:81-86
Monte Carlo analysis of a low power domino gate under parameter fluctuation
Wang Jinhui;Wu Wuchen 1;Gong Na 2;Hou Ligang 1;Peng Xiaohong 1;and Gao Daming 1
..............page:113-117
A 1.5Gb/s monolithically integrated optical receiver in the standard CMOS process
Xiao Xindong;Mao Luhong;Yu Changliang;Zhang Shilin;and Xie Sheng
..............page:77-80
Tunable current mirror and its application in LNA
Li Kun 1;Teng Jianfu1;2;Yu Changliang 1;and Huang Jianyao 1
..............page:123-127
Enhancement-mode AlGaN/GaN HEMTs fabricated by fluorine plasma treatment
Quan Si;Hao Yue;Ma Xiaohua Xie Yuanbin;and Ma Jigang
..............page:21-24
Author index to Volume 30
..............page:137-154
A radiation-hardened-by-design technique for improving single-event transient tolerance of charge pumps in PLLs
Zhao Zhenyu;Zhang Minxuan;Chen Shuming;Chen Jihua;and Li Junfeng
..............page:108-112