Chinese Journal of Semiconductors 2005 Issue 5 An Alternative Method for SU-8 Removal Using PDMS Technique

An Alternative Method for SU-8 Removal Using PDMS Technique
Li Jianhua;CHEN Di;Zhang Jinya;LIU Jingquan;Zhu Jun

..............page:899-903

Theoretical Analysis of Effect of LUT Size on Area and Delay of FPGA
Gao Haixia;Yang Yintang;Dong Gang

..............page:893-898

An Asynchronous Implementation of Add-Compare-Select Processor for Communication Systems
Zhao Bing;Qiu Yulin;Lü Tieliang;HEI Yong

..............page:886-892

Effect of LPE-HgCdTe Composition Ununiformity on Infrared Transmission Spectra
Wang Qingxue;Wei Yanfeng;Yang Jianrong;He Li

..............page:904-909

Two Kinds of Nucleation Mechanisms for Oxygen Precipitation in CZ Silicon with High Carbon Concentration
Liu Peidong;Jiang Yiqun;Huang Xiaorong;Shen Yijun;Li Liben;Que Duanlin

..............page:910-916

Influence of Dispersion on ZnO and GaN XRD Rocking Curves
Wang Li;Fang Wenqing;Pu Yong;Zheng Changda;Dai Jiangnan;Mo Chunlan;Jiang Fengyi

..............page:917-921

Preparation and Photoluminescence Characteristic of SnO: Sb Thin Films
Wang Yuheng;Ma Jin;Ji Feng;Yu Xuhu;ZHANG Xijian;Ma Honglei

..............page:922-926

Preparation and Charge Storage Characteristics of Silicon Nanoparticles
JIAO Zheng;Li Zhen;WU Minghong;LU Senlin;WANG Deqing

..............page:927-930

Synthesis of GaN Nanowires Through Ammoniating ZnO/Ga2O3 Films on Si Substrates
Gao Haiyong;Zhuang Huizhao;Xue Chengshan;Wang Shuyun;He Jianting;DONG Zhihua;Wu Yuxin;Tian Deheng

..............page:931-935

4H-SiC Homoepitaxial Growth by Horizontal Cold-Wall Chemical Vapor Deposition
Gao Xin;SUN Guosheng;Li Jinmin;Zhao Wanshun;Wang Lei;Zhang Yongxing;Zeng Yiping

..............page:936-940

Fabrication Technique of p-Type (100) Silicon-Based Two-Dimensional Photonic Crystals
Zhang Wanyun;Ji Jiarong;Yuan Xiaodong;YE Weimin;Zhu Zhihong

..............page:941-946

Growth and Electrical Properties of (100)-Oriented CVD Diamond Films
Su Qingfeng;XIA Yiben;Wang Linjun;Zhang Minglong;Lou Yanyan;Gu Beibei;SHI Weimin

..............page:947-951

Microcrystalline Silicon Material and Solar Cells Fabricated by VHF-PECVD
Zhang Xiaodan;Zhao Ying;Zhu Feng;Wei Changchun;Gao Yantao;Sun Jian;Hou Guofu;Xue Junming;Geng Xinhua;Xiong Shaozhen

..............page:952-957

Research on Ⅲ-Ⅴ Bandgap Graded Solar Cells
Peng Hua;Zhou Zhibin;Cui Rongqiang;Ye Qinghao;Pang Qianjun;Chen Mingbo;Zhao Liang

..............page:958-964

Measurement of Specific Contact Resistivity of Ohmic Contact on p-GaN
Xue Song;Han Yanjun;Wu Zhen;Luo Yi

..............page:965-969

A Preliminary Analysis on Surface Contamination of Silicon Wafer by Cu and Fe
ZHENG Xuan;CHENG Xuan

..............page:970-976

Numerical Study of Transport Phenomena in a Radial Flow MOCVD Reactor with Three-Separate Vertical Inlets
Zuo Ran;Zhang Hong;LIU Xianglin

..............page:977-982

A New Model of Ferroelectric Capacitor Based on C-V, I-V,Q-V Characteristics
Chen Xiaoming;Tang Ting'ao

..............page:983-989

AlGaN/GaN HEMT on Sapphire Using FC Bonding
Chen Xiaojuan;Liu Xinyu;SHAO Gang;Liu Jian;He Zhijing;Wang Suofa;Wu Dexin

..............page:990-993

A Simplified VBIC Model and InGaP/GaAs HBT Wideband Amplifier Design
Sun Lingling;Liu Jun

..............page:994-998

An In-Situ Extracting Method for Residual Stresses of a Multilayer Film by Full-Field Optical Measurement
Nie Meng;Huang Qingan;Li Weihua

..............page:1028-1032

Simulation of Vacuum Package for MEMS Devices with Solder Bonding
Cheng Yingjun;Jiang Yuqi;Xu Wei;LUO Le

..............page:1033-1039

An Optimized Micro-Rotating Structure for Measuring Residual Strain of Thin Films
Liu Zutao;Huang Qingan;Li Weihua

..............page:1040-1044

A 2. 4GHz 0. 35μm CMOS Gilbert Down-Conversion Mixer
Cui Fuliang;Huang Lin;Ma Dequn;HONG Zhiliang

..............page:1045-1048

A 2.4GHz CMOS Injection-Locked Frequency Doubler
Yi Xiaofeng;SU Yanfeng;Zhu Zhen;HONG Zhiliang

..............page:1049-1053

Yield Modeling of IC Based on Distribution of Defect Shapes
WANG Junping;Hao Yue

..............page:1054-1058

Electroless Copper and Nickel Plating on Single-Crystal Silicon for MEMS Applications
HAN Xiang;Li Yi;Wu Wengang;Yan Guizhen;Hao Yilong

..............page:1059-1064

Enhanced Exposure Model and Its Parameter Measurements for Thick Photoresist
Liu Shijie;Du Jinglei;DUAN Xi;Luo Boliang;Tang Xionggui;Guo Yongkang;Du Chunlei

..............page:1065-1071

Strained-Si pMOSFETs on Very Thin Virtual SiGe Substrates
Li Jingchun;Tan Jing;YANG Mohua;Zhang Jing;Xu Wanjing

..............page:881-885

A New Low Voltage RF CMOS Mixer Design
Liu Lu;Wang Zhihua

..............page:877-880

Design and Realization of a Monolithic GaAs 3Bit Phase Digitizing DAC
Zhang Youtao;Xia Guanqun;Li Fuxiao;GAO Jianfeng;Yang Naibin

..............page:873-876

An Accurate 1.08GHz CMOS LC Voltage-Controlled Oscillator
Tang Zhangwen;He Jie;Jian Hongyan;MIN Hao

..............page:867-872

Sensitivity of Total-Dose Radiation Hardness of SIMOX Buried Oxides to Doses of Nitrogen Implantation into Buried Oxides
Zheng Zhongshan;Liu Zhongli;Zhang Guoqiang;Li Ning;LI Guohua;Ma Hongzhi;Zhang Enxia;Zhang Zhengxuan;Wang Xi

..............page:862-866

A Novel Local-Dielectric-Thickening Technique for Performance Improvements of Spiral Inductors on Si Substrates
Yang Rong;Li Junfeng;Zhao Yuyin;Chai Shumin;Han Zhengsheng;Qian He

..............page:857-861

Widely Tunable Sampled-Grating DBR Laser
Kan Qiang;Zhao Lingjuan;Zhang Jing;Zhou Fan;Wang Baojun;Wang Lufeng;Wang Wei

..............page:853-856

Substrate Current Characteristics After Soft Breakdown in Ultra-Thin Gate Oxide nMOSFETs Under Constant Voltage Stress
WANG Yangang;Xu Mingzhen;Tan Changhua;Duan Xiaorong

..............page:999-1004

Coupled Effect of Hot-Carrier Injection and Negative Bias Temperature in pMOSFET's
LIU Hongxia;Hao Yue

..............page:1005-1009

Accuracy Correction of Transient Thermal Resistance Test of Bipolar Transistors via Method of △Vbe
Li Jihong;JIA Ying;KANG Rui;GAO Cheng

..............page:1010-1014

Numerical Simulation of Photoelectric Characteristics of Three-Channel Bulk Charge-Coupled Device in Region of Near-IR
Song Min;Zhang Ying;Wang Yuxin;Zheng Yaru

..............page:1015-1019

Design and Fabrication of 50/100GHz AWG Based Interleaver
Dou Jinfeng;HAN Peide;Hu Xiongwei

..............page:1020-1023

Temperature Characteristics of 850nm Oxide Confined VCSELs
Zhang Yongming;Zhong Jingchang;Zhao Yingjie;Hao Yongqin;Li Lin;Wang yuxia;Su Wei

..............page:1024-1027