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Chinese Journal of Semiconductors
0253-4177
2003 Issue 8
ESD and Its Related Mechanisms on LDD-CMOS
ma wei ; hao yue
..............page:892-896
Model and Simulation of Impurity Distribution for Silicon Direct Bonding
zhang pei jun ; huang qing an
..............page:887-891
Wavelength Conversion Based on Cross-Polarization Modulation in Semiconductor Optical Amplifiers
huang li rong ; huang de xiu ; zuo qing yuan
..............page:882-886
Simulation of Performance and Optimal Design of Condenser Microphone
ning zuo ; liu zhong li
..............page:877-881
A CMOS High Dynamic Range Variable Gain Amplifier
zheng ji hua ; li yong ming ; chen hong yi
..............page:871-876
Close-Loop Data-Acquisition System for Thermally Excited Resonant Microbeam Pressure Sensor
fan zhao yan ; cui da fu ; chen de yong ; gao xiao tong
..............page:866-870
Fabrication and Analysis of Micromachined Cantilever Array
yu xiao mei ; zhang da cheng ; li zuo ; wang xiao bao ; ruan yong ; du xian feng
..............page:861-865
GaAs MESFET's Reliability and New Method of Rapid Evaluation
li zhi guo ; song zeng chao ; sun da peng ; cheng yao hai ; zhang wan rong ; zhou zhong rong
..............page:856-860
Principle of Photoelectric Dual Base Transistor
xia ke jun ; li shu rong ; li dan ; zheng yun guang ; mao lu hong ; guo wei lian
..............page:850-855
Research on AlGaN/GaN HEMT
zhang xiao ling ; lv chang zhi ; xie xue song ; li zhi guo ; cao chun hai ; li fu xiao ; chen tang sheng ; chen xiao jian
..............page:847-849
A Novel LP-MOCVD Butt-Joint Growth Method on MQW Electroabsorption-Modulated DFB Lasers
hu xiao hua ; wang zuo ; zhu hong liang ; wang bao jun ; li bao xia ; zhou fan ; tian hui liang ; shu hui yun ; bian jing ; wang lu feng
..............page:841-846
Characterization of Metallic Impurity Contamination During High Dose Implantation of Oxygen into Silicon Using ICP-AES
ma zuo rong ; li xue chun ; liang hong ; wu hu cai ; li xiao min ; chen ru yi ; luo zuo ; lu zhi heng
..............page:813-816
Distortion Behavior for SOI MOSFET
Zhang Guoyan;Huang Ru;Zhang Xing;WANG Yangyuan
..............page:809-812
An Improved Method to Extract Generation of Interface Trap in Hot-Carrier-Stressed LDD n-MOSFET
Yang Guoyong;Mao Lingfeng;Wang Jinyan;Huo Zongliang;Wang Ziou;Xu Mingzhen;Tan Changhua
..............page:803-808
RF MEMS Switch on Poly-Silicon Substrate
Zhang Zhengyuan;Wen Zhiyu;Xu Shiliu;Zhang Zhengfan;Liu Yukui;Li Kaicheng;Huang Shanglian
..............page:798-802
Measurement of 3db Bandwidth of Laser Diode Chips
XU Yao;Wang Wei;Wang Ziyu
..............page:794-797
Measurement of Cavity Loss and Quasi-Fermi-Level Separation for Fabry-Pérot Semiconductor Lasers
Han Chunlin;Liu Ruixi;Guo Weihua;Yu Lijuan;HUANG Yongzhen
..............page:789-793
Preparation and Properties of CdS Films for Solar Cells
li bing ; feng liang huan ; zheng jia gui ; cai ya ping ; cai wei ; li wei ; wu li li
..............page:837-840
Growth of High Resistance Cd1-xZnxTe Crystal and Its Property Investigations
li guo qiang ; gu zhi ; jie wan qi
..............page:833-836
Microstructure and Photoluminescence Spectroscopy on CSS Deposited CdTe Films
wu li li ; feng liang huan ; cai wei ; zhang jing quan ; cai ya ping ; zheng jia gui ; zhu ju mu ; chen nuo fu
..............page:827-832
Surface States and Other Local States in AlxGa1-xN Barriers of Modulation-Doped AlxGa1-xN/GaN Heterosturctures
liu jie ; shen bo ; zhou yu gang ; zhou hui mei ; zheng ze wei ; zhang rong ; shi yi ; zheng you
..............page:822-826