Sub-Microscale Temperature Distributions Measured by Scanning Thermal Microscopy
XIE Zhi-gang;HAN Li;DONG Zhan-min;WANG Xiu-feng;CHEN Hao-ming;GU Yu-qin;JIN Hong-shi

..............page:620-624

Technological Investigation of Contact Hole Filling and Aluminum Metallization Process in Sub-Micron IC Devices
LIANG Jing;HUANG Rong-xu;ZHENG Guo-xiang;LIN Jian;PANG Hai-zhou;ZONG Xiang-fu

..............page:614-619

Recoverable Unstable Phenomena in PLED
LIU En-feng;XIONG Shao-zhen;ZHAO Ying;XIE Wei-liang;WU Chun-ya;ZHOU Zhen-hua;HU Jing-kang;ZHANG Wen-wei;SHEN Jin-yuan;CHEN Jian-sheng;ZHANG Yuan-yue;ZHANG Li-zhu

..............page:580-585

Annealing Behavior of Microstructure in a-SiOx:H/a-SiOy: H Multilayer Films
GUO Zhen-ning;GUO Zhen-ning;HUANG Yong-zhen;GUO Heng-qun;LI Shi-chen;WANG Qi-ming

..............page:576-579

Preparation of Crystal Oriented α-SiC Films by Pulsed ArF Laser Deposition on Si(111)
WANG Yu-xia;WEN Jun;GUO Zhen;TANG Hong-gao;HUANG Ji-po;WANG Lian-wei;LIN Cheng-lu

..............page:570-575

Surface Reaction Mechanism of SiGe/Si Growth by UHV/CVD
YU Zhuo;LI Dai-zong;CHENG Bu-wen;HUANG Chang-jun;LEI Zhen-lin;YU Jin-zhong;WANG Qi-ming;LIANG Jun-wu

..............page:564-569

PPC Effect and Localization in Ge-doped ZnSe Epilayer
ZHANG Lei;HU Gu-jin;DAI Ning;CHEN Liang-yao

..............page:559-563

Micro-Raman-Scattering Spectra of GaN Films
TONG Yu-zhen;ZHANG Guo-yi;Ming S.Liu;L.A.Bursill

..............page:554-558

Growth of High Quality Cubic-Phase InGaN
LI Shun-feng;YANG Hui;XU Da-peng;ZHAO De-gang;SUN Xiao-ling;WANG Yu-tian;ZHANG Shu-ming

..............page:548-553

Properties of Y-Silicides Synthesized Layer by Y Implantation and RTA Annealing
ZHANG Tong-he;WU Yu-guang

..............page:542-547

A Novel Depletion-Mode MOS Gated Emitter Shorted Thyristor
ZHANG He-ming;DAI Xian-ying;ZHANG Yi-men;MA Xiao-hua;LIN Da-song

..............page:536-541

A Monolithically Integrated 12V/5V Switch-Capacitor DC-DC Converter
GENG Li;CHEN Zhi-ming;LIU Xian-feng

..............page:529-535

Growth of Thin Silicon on Sapphire (SOS) Film Materials and Device Applications
WANG Qi-yuan;NIE Ji-ping;LIU Zhong-li;YU Yuan-huan

..............page:521-528

Reliability of n-GaAs Ohmic Contact With TiN Diffusion Barrier
ZHANG Wan-rong;LI Zhi-guo;MU Fu-chen;CHENG Yao-hai;SUN Ying-hua;GUO Wei-ling;CHEN Jina-xin;SHEN Guang-di;ZHANG Yu-qing;ZHANG Mu-yi

..............page:608-613

Network Analysis of High Frequency Noise of Microwave Bipolar Transistors Based on Z Parameters
QIAN Wei;ZHANG Jin-shu;JIA Hong-yong;LIN Hui-wang;TSIEN Pei-xin

..............page:602-607

High Speed Current Domain CMOS D/A Converter Design
XU Yang;MIN Hao

..............page:597-601

Fabrication and Characterization of High Speed SOI MOS Devices and Ring-Oscillators
HUANG Ru;ZHANG Xing;SUN Sheng;WANG Yang-yuan

..............page:591-596

Organic Conductive Films Filled by Carbon Nanotubes/Graphite
LI Hong-jian;PENG Jing-cui;CHEN Xiao-hua;OU Gu-ping

..............page:586-590