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Progress in Natural Science
1002-0071
1996 Issue 5
THERMAL CHARACTERISATION OF MICROELECTRONICS MATERIALS AT VARIOUS SCALES
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page:467
Thermoelastic and electronic strain contributions to the frequency transmission photoacoustic effect in semiconductors
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page:471
Fresnel diffraction theory for surface photo-displacement in semiconductors
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page:475
Characterization of electronic transport properties in semiconductors by scanning photothermal microscopy
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page:479
Photoacoustic frequency transmission technique:carrier transport parameters measurements in semiconductor bulk and thin film samples
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page:483
Heat transport monitoring in porous silicon by the photoacoustic technique
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page:487
Determination of thermal diffusivity of semiconductors using transmission PDS
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page:491
Noncontact Photothermal Radiometric Deep-Level Transient Spectroscopy of Undoped Semi-Insulating GaAs
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page:494
Analysis of Subsurface Damage in Silicon by Photoluminescence and Photothermal Heterodyne Methods
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page:498
Photothermal investigation of implanted Si wafers:Influence of thermal diffusivity
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page:503
Photothermal reflection signal versus temperature:Study of implanted Si wafers
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page:507
Photothermal Characterization of Ion Implanted SiC
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page:511
Photothermally modulated optical and microwave response from ion implanted semiconductors
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page:515
Quantitative thermal imaging of current densities and heat flow in electronic microstructures
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page:519
Second-harmonic photoacoustic imaging of dynamic integrated circuits
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page:524
Photoacoustic subsurface defects inspection in semiconductor technology
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page:528
Evaluation of ROM Chips Using Modulated Photo-Reflectance Technique
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page:531
Investigation of 980 nm waveguide lasers by photothermal microscopy
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page:535