1672-7126
2012 Issue 1
Mechanisms Responsible for Cracks and Overlaps of Al Films Deposited on Liquid Substrates
Yu Senjiang;Zhou Man;Jiang Weishun;Hong Yang;Chen Miaogen
Yu Senjiang;Zhou Man;Jiang Weishun;Hong Yang;Chen Miaogen
..............page:25-29
SiNx Buffer Layers and Transparence Improvement of Indium-Tin-Oxide Electrode
Liu Xiang;Xue Jianshe;Zhou Weifeng;Dai Tianming;Hao Zhaohui;Yang Jing;Ning Ce;Zhang Xuehui;Sun Bing
Liu Xiang;Xue Jianshe;Zhou Weifeng;Dai Tianming;Hao Zhaohui;Yang Jing;Ning Ce;Zhang Xuehui;Sun Bing
..............page:36-38
Impacts of Electron Beam on Growth and Tribological Property of TiAlN Films Deposited by Multi-Arc Ion Plating
Wu Hua;Song Li;Li Xuesong;Yang Yue
Wu Hua;Song Li;Li Xuesong;Yang Yue
..............page:19-24
Photocatalystic Property of TiO2 Films Deposited under Ambient Conditions
Liu Zhongwei;Li Sen;Chen Qiang;Wang Zhengduo;Yang Lizhen
Liu Zhongwei;Li Sen;Chen Qiang;Wang Zhengduo;Yang Lizhen
..............page:1-5
Reduction of Laser Induced Damages of Diamond-Like-Carbon Films with External Bias
Wu Shenjiang;Su Junhong;Shi Wei;Wang Xinmei;Xu Junqi
Wu Shenjiang;Su Junhong;Shi Wei;Wang Xinmei;Xu Junqi
..............page:11-14
Characterization of SiC/Al2O3 Interface by Synchrotron Radiation X-Ray Grazing Incident Diffraction
Liu Zhongliang;Kang Chaoyang;Tang Jun;Chen Xiangcun;Xu Pengshou;Pan Guoqiang
Liu Zhongliang;Kang Chaoyang;Tang Jun;Chen Xiangcun;Xu Pengshou;Pan Guoqiang
..............page:79-82
Enhancement of Chromatographic Resolution by Applying Differential Gas Chromatography/Mass Spectroscopy
Song Shuang;Wang Yan;Jiang Xuehui;Huang Chao
Song Shuang;Wang Yan;Jiang Xuehui;Huang Chao
..............page:74-78
Surface Modification of AZ31 Mg Alloys by Depositing Silicon Nitrides Films
Mu Zongxin;Zang Hairong;Liu Bingbing;Lin Qu;Ding Anbang;Wang Chun;Dong Chuang
Mu Zongxin;Zang Hairong;Liu Bingbing;Lin Qu;Ding Anbang;Wang Chun;Dong Chuang
..............page:6-10
Simulation of Electron Scattering and Transmission in Characterization of Thick Films by Scanning Transmission Electron Microscopy
Wang Fang;Cao Meng;Zhang Haibo
Wang Fang;Cao Meng;Zhang Haibo
..............page:68-73
Simulation of Magnetic Cluster Growth on 2-D Triangular Lattice Based on Power Law Interaction
Wu Yiqi;Xu Xiaojun
Wu Yiqi;Xu Xiaojun
..............page:63-67
..............page:后插2
Molecular Dynamics Study of Interaction between Fluorine Atoms and Silicon Surface
Zhao Chengli;Deng Chaoyong;Sun Weizhong;Lü Xiaodan;Chen Feng;He Pingni;Zhang Junyuan;Liu Yujie;Gou Fujun
Zhao Chengli;Deng Chaoyong;Sun Weizhong;Lü Xiaodan;Chen Feng;He Pingni;Zhang Junyuan;Liu Yujie;Gou Fujun
..............page:53-58
Reduction of Accumulated Charges on MgO Films by Adjusting Pulsed Bias
Zhu Daoyun;Zheng Changxi;Wang Mingdong;Chen Dihu;He Zhenhui;Wen Lishi
Zhu Daoyun;Zheng Changxi;Wang Mingdong;Chen Dihu;He Zhenhui;Wen Lishi
..............page:48-52
Equivalent Circuit Simulation of Double-Gap Coupled Input Cavity
Huang Chuanlu;Ding Yaogen;Wang Yong;Xie Xingjuan
Huang Chuanlu;Ding Yaogen;Wang Yong;Xie Xingjuan
..............page:39-43
Microstructures and Emission Characteristics of Porous Silicon Films
Luo Wen;Hu Wenbo;Zheng Yu;Song Zhongxiao;Wu Huiyan
Luo Wen;Hu Wenbo;Zheng Yu;Song Zhongxiao;Wu Huiyan
..............page:30-35
Development of Large-Sized Window of Heavy Ion Accelerator Used As Cancer Therapy Terminal
Meng Jun;Zhang Junhui;Yang Weishun;Luo Cheng;Yang Xiaotian;Ma Xingli;Bai Feng;Guo Dizhou;Nie Zengsen;Niu Zhiwei;Lou Meiling
Meng Jun;Zhang Junhui;Yang Weishun;Luo Cheng;Yang Xiaotian;Ma Xingli;Bai Feng;Guo Dizhou;Nie Zengsen;Niu Zhiwei;Lou Meiling
..............page:59-62
Studies of Vacuum Switching Arc at Short-Gap by Image Processing
Dong Huajun;Shi Guiming;Song Chunyu;Wang Hongyan;Liu Shenzhan;Guo Yuxiang
Dong Huajun;Shi Guiming;Song Chunyu;Wang Hongyan;Liu Shenzhan;Guo Yuxiang
..............page:44-47
Surface Modification of Cr12MoV Steel by Depositing C-Doped TiB2 Films
Xin Xiling;Xu Xiaojing;Fan Zhen;Tian Kun;Chen Dan;Yu Chunhang;Sheng Xinlan
Xin Xiling;Xu Xiaojing;Fan Zhen;Tian Kun;Chen Dan;Yu Chunhang;Sheng Xinlan
..............page:15-18