1681-5289
2015 Issue 3
..............page:1-16
wo guo shi pin jian kong ji qi tu xiang chu li (isp) ji shu de fa zhan tan tao
zhao jian zhong ;, yang xiao qi ;
zhao jian zhong ;, yang xiao qi ;
..............page:17-21,40
Method of RTL-to-Gate Logic Equivalence Checking
TIAN Su-lei;,LIU Hai-long;,LIU Shu-tao;
TIAN Su-lei;,LIU Hai-long;,LIU Shu-tao;
..............page:22-25,60
..............page:26-29,73
Research on WHIRL Intermediate Representation Generation of BWDSP SIMD Instructions
WANG Hao;,WANG Xiang-qian;
WANG Hao;,WANG Xiang-qian;
..............page:30-35
gao su zhuan huan qi jian jie he gong zuo yuan li
dave robertson;
dave robertson;
..............page:36-40
..............page:41-46,55
The Design and Implement of the automation tool analyzing test data based on Perl
GAO Jian-xin;,LU Xiao-mei;,ZOU Ming-hong;
GAO Jian-xin;,LU Xiao-mei;,ZOU Ming-hong;
..............page:47-50
Design and verification of SPI interface Used in Navigation Chip
SONG He-juan;,ZHU Jia-bin;
SONG He-juan;,ZHU Jia-bin;
..............page:51-55
The design of automatic data statistics system based on Android
LI Wen-bin;,CHEN Jin-ying;,WANG Wei-jie;,HU Bo;
LI Wen-bin;,CHEN Jin-ying;,WANG Wei-jie;,HU Bo;
..............page:56-60
..............page:61,83
Investigations of Hot Carrier Injection on NMOSFET with High Vds and Low Vgs Stress
SHAN Wen-guang;,SONG Yong-liang;,Jacky XU;,Jeff WU;,Atman ZHAO;,Kary Chien;
SHAN Wen-guang;,SONG Yong-liang;,Jacky XU;,Jeff WU;,Atman ZHAO;,Kary Chien;
..............page:62-66,87
The influence of load on SiC wafer polishing quality
WEN Chao;,LI Ke;,HE Wen-hai;,MU Wei;
WEN Chao;,LI Ke;,HE Wen-hai;,MU Wei;
..............page:67-73
..............page:74-78
ji yu freescale kinetis ea xi lie mcu de can bootloader she ji
wang xiao xiang ;, sun tao ;
wang xiao xiang ;, sun tao ;
..............page:79-83
li yong mems mai ke feng zhen lie ding wei bing shi bie yin pin huo yu yin xin yuan
m.malcangi;,m.d'aria;,r.sannino;,l.spelgatti;
m.malcangi;,m.d'aria;,r.sannino;,l.spelgatti;
..............page:84-87