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Instrument Standardization and Metrology
1672-5611
2008 Issue 1
Measurement of Thickness of the Thin Film Using Reflectance Spectrum of the White Light
Liu Yingying;Ke Weiping;Dong Zhanmin;Gao Hong
..............page:45-46
Principle and Performance about 3151 Earth HiTester
Yang Huimin;Bu Yunping;Chen Jun;Zhang Xiaohua
..............page:36-38
Regulation and Service on HR-150A Rockwell Hardness Tester
Zhou Yaping
..............page:34-35
Design and Realization of the DDC Temperature System
Cao Lixue;Ling Zhaoxia
..............page:26-28
Design and Implementation of CAN Gateway Based on GPRS
Li Huixiu;Zheng Shifu
..............page:22-23,31
Safety in Common Industrial Protocol (CIP)
Hua Rong
..............page:6-10
Report of the IEC/TC65 in France
iec/tc66 zhong guo dai biao tuan
..............page:1-2,21
News Update
..............page:Ⅰ-Ⅴ