Review of biometric template protection
Wu Lifang;Ma Yukun;Zhou Peng;Zheng Weishi;School of Electronic Information and Control Engineering;Beijing University of Technology;School of Information Engineering;Henan Institute of Science and Technology;School of Data and Computer Science;Sun Yat-sen University;
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Precision tilting platform used for static calibration of accelerometers
Xu Guanhua;He Wen;Fu Jianzhong;Xu Yuetong;Lin Zhiwei;Zhejiang Province Key Lab of Advanced Manufacturing Technology;Zhejiang University;Kunshan Industrial Technology Research Institute Co.;Ltd;Zhejiang University Kunshan Innovation Institute;Suzhou Zijingang Intelligent Manufacturing Equipment Co.;Ltd;
..............page:2452-2458
New self-calibration method of circular grating eccentric parameters
Feng Chaopeng;Zhu Lianqing;Pan Zhikang;Guo Yangkuan;Beijing Key Laboratory for Optoelectronic Measurement Technology;Beijing Information Science and Technology University;Beijing Engineering Research Center of Optoelectronic Information and Instruments;Beijing Information Science and Technology University;
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