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Stress processing based TCXO
Bai Lina;Zhou Wei;Li Wanying;Zhang Ying;Chen Hongjie;School of Mechano-Electronic Engineering;Xidian University;
..............page:1594-1599
Comparison measurement of digital modulation quality parameters
Zhou Xin;Zhong Zhangdui;Bian Xin;Ai Bo;Xiong Lei;An Ying;State Key Laboratory of Rail Traffic Control and Safety;Beijing Jiaotong University;Division of Electronics and Information Technology;National Institute of Metrology;Beijing Xicheng Institute for Drug Control;
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New method of evaluating the pipetting of automatic ELISA system
Chang Haitao;Zhu Lianqing;Lou Xiaoping;Guo Yangkuan;Wang Zhongyu;School of Instrumentation Science & Opto-Electronics Engineering;Beihang University;Beijing Key Laboratory for Optoelectronic Measurement Technology;Beijing Information Science & Technology University;
..............page:1622-1629
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