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Journals   A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Journal of Computer-Aided Design & Computer Graphics
1003-9775
2011 Issue 3
Fast Mapping of Nano/CMOS Circuit Cells
Chu Zhufei;Xia Yinshui;Wang Lunyao
..............page:514-520
Methodology of Asynchronous Integrated Circuit Design-a Survey
Ren Hongguang;Shi Wei;Wang Zhiying;Su Bo;Wang Yourui
..............page:543-552
Fast Circuit Delay Calculation Based on SAT Solvers
He Zijian;Lu Tao;Li Huawei;Li Xiaowei
..............page:480-487
Building Resilient NoC with a Reconfigurable Routing Algorithm
Fu Binzhang;Han Yinhe;Li Huawei;Li Xiaowei
..............page:448-455
Chan-Vese Model Image Segmentation with Neighborhood Information
Yang Mingyu;Ding Huan;Zhao Bo;Zhang Wensheng
..............page:413-418
Formal Equivalence Checking Guided Soft Error Vulnerable Spots Selection
Zhu Dan;Li Tun;Li Sikun
..............page:465-470
Connectivity Constrained Graph-Cut for Fast Interactive Image Segmentation
Zheng Jiaming;Chen Zhaojiong
..............page:399-405
Rank Constraint Based Multi-Frame Correspondence Estimation Algorithm
Guo Jidong;Li Xueqing
..............page:433-441
Tone-Preserving Colorization of Black-and-White Cartoon Image
Zhu Wei;Liu Ligang
..............page:392-398
A Simulated Annealing FPGA Placement Algorithm Based on Unified Critical Path Delay
Li Peng;Lan Julong;Li Lichun
..............page:521-526
Digital Watermarking for 3D Process Plant Models Based on Logistic Chaotic System
Su Zhiyong;Li Weiqing;Dai Yuewei;Tang Weiqing
..............page:426-432
Design for High-Speed Circular FIFO
Peng Yao;Zhou Duan;Yang Yintang;Zhu Zhangming
..............page:488-495
The Application of Constraint-Procedure Information in Software Static Testing
Jin Dahai;Gong Yunzhan;Yang Zhaohong;Xiao Qing
..............page:534-542
3D Reconstruction of Non-rigid Shapes Using One TOF Camera
Tong Jing;Xiang Xueqin;Tian Hongbo;Pan Zhigeng;Zhang Mingmin
..............page:377-384
Coverage Matrix based Evolutionary Test Program Generation for Microprocessor Verification
Zhang Liang;Tong Dong;Cheng Xu;Wang Keyi
..............page:456-464
Optimization of Model Checking-Based Test Generation
Zeng Hongwei;Miao Huaikou
..............page:496-502
Testability-Oriented Module Allocation Method in High Level Synthesis
Cheng Benmao;Wang Hong;Yang Shiyuan;Wang Chongbin
..............page:503-507
Visual Attention-Based Ship Detection in Multispectral Imagery
Ding Zhenghu;Yu Ying;Wang Bin;Zhang Liming
..............page:419-425
Testing Inter-port Faults in Embedded Multi-Port SRAM
Shan Hekun;Chen Zewang;Cui Jiang;Wang Youren
..............page:471-479