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Electronic Products China
1004-9606
2004 Issue 4
chang shang dong xiang
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page:83-87
ye jie dong tai
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page:64-82
gou jian mo ni shi jie yu shu zi shi jie de qiao liang -- mei guo mo ni qi jian gong si de ji shu zou xiang
liu hong
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page:61-63
The optimization of C code in TMS320C54X
qian jun ; wang zuo rong
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page:29-31
The theory and realization of narrow band IF sampling on DSP_C54X
xia zhi zhong ; lin chuang ; xu lin
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page:25-28
xin pin fa bu
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page:56-60
PRODUCT HGHLIGHTS
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page:51-55
2004 nian di shi qi jie zhong guo dian zi yuan jian bai qiang qi ye ming dan
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page:49-50
Economic analysis of top 100 in electronic industry
gu qun
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page:45-48
dian yuan guan li chan pin shi chang zeng chang qiang jin , chang shang mian lin xin tiao zhan
zhao xue qin
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page:44
Precise and cheap ADC for domestic and industrial applications
cirruslogic gong si
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page:42-43
Analyze and design jitter performance in high speed circuit
wang hong wei
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page:40-41
The new open standard for mobile video interface
liu hong
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page:39-39,36
isuppli:2003 quan qiu 20 da ban dao ti chang shang pai xing bang
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page:38
The choice of echo eliminates communication card
DOUG MORRISSEY
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page:37-38
Using D amplifier to improve the efficiency of audio amplification
Mike Score
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page:32-36
Low voltage hot swap and power sequence control
li yong jun
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page:24-24,36
Detect the relaying protector synchronously based on GPS
zhao xiao yu ; chen jian ; fu feng lin
..............
page:21-23
Realize the communications among the modular machine tools on CAN Bus
jiang jiang ; wu chang qi
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page:18-20
Online testing of CDMA/GSM mobile telephone
fang zuo ; rong hua ; shao zuo
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page:15-17
HDI packaging technology push testing technology development
xian fei
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page:13-14
Embedded image collection system and software
zhu rui ; yang lei
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page:12-12
Advanced trigger system track complex signal
tai ke gong si
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page:10-11
Virtual instruments software of EWB and its applications
deng zhong yi
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page:7-9,11
Interlinkage testing based on JTAG
zhang xue bin
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page:5-6
APEC 2004
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page:2-4
Memory makers push density,speed to next level
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page:2-2
Chip technology eliminates soft errors
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page:1-1
All-digital LCoS challenges industry
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page:1