1000-1158
1999 Issue 3
The Quantized Error of Pulse-Counting with Gate-Controlling and Uncertainty of Digitized Measurement
Zou Shuwen;Lin Tianzhang;Huang Guanggui
Zou Shuwen;Lin Tianzhang;Huang Guanggui
..............page:234
The Equivalent Sampling Period Method for the Identification and Evaluation of the Transfer Function of Data Acquisition Systems
Liang Zhiguo;Zhu Jijie
Liang Zhiguo;Zhu Jijie
..............page:227-233
The Effects Estimation of A/D Quantizing Error Nonlinearity and Differential Nonlinearity Errors on the Asynchronous and Quasi-synchronous Sampling Algorithms
Wang Xuewei;Wang Xianghong;Liang Yuanhua
Wang Xuewei;Wang Xianghong;Liang Yuanhua
..............page:219-226
A Laser Polarization System for Vibration Measurement in Wide Frequency Range
Xu Min;You Yifeng;Zhuo Yongmo;Mu Xudong
Xu Min;You Yifeng;Zhuo Yongmo;Mu Xudong
..............page:214-218
Study on the Damping Chamber Used to Measure Mean Flowrate of Pulsating Gas Flow
Han Baishun;Wang Bonian
Han Baishun;Wang Bonian
..............page:208-213
Fuzzy Measurement Model of the Average Particle Size in Fluidized Bed
Zheng Jianying;Zhu Yun
Zheng Jianying;Zhu Yun
..............page:203-207
A Statistical Study of Mathematical Model for Capacity Grain Moisture Measuring Apparatus
Wu Jiaqun;Zhong Liren;Wang Weihua;Yuan Xianxin
Wu Jiaqun;Zhong Liren;Wang Weihua;Yuan Xianxin
..............page:197-202
An Investigation of Physical Model for Measuring Thermal Diffusivity of Semi-Transparent Materials
Liu Xiongfei;Xue Jian
Liu Xiongfei;Xue Jian
..............page:193-196
The Measurement of Cutting Temperature by Equivalent Thermocouple Methods
Liu Xianli;Yuan Zhejun;Chen Bo;Meng An;Chen Liguo;Yan Fugang;Li Zhenjia
Liu Xianli;Yuan Zhejun;Chen Bo;Meng An;Chen Liguo;Yan Fugang;Li Zhenjia
..............page:186-192
Investigation of the Dynamic Characteristic of the Thin-film
Thermocouple and Dynamic Compensation
Lei Mei;Wang Zhizhong;Ma Qindi;Lei Min
Lei Mei;Wang Zhizhong;Ma Qindi;Lei Min
..............page:182-186
A New Automatic-tester for Dazzle Lamps
He Shunzhong;Wang Zhizhong;Diao Donghong;Fu Weiqiao
He Shunzhong;Wang Zhizhong;Diao Donghong;Fu Weiqiao
..............page:177-181
The Establishment of Secondary Standard for Total Radiant Flux of 253.7nm Radiation Source
Sun Dingwen;Xiao Wenbin
Sun Dingwen;Xiao Wenbin
..............page:172-176
..............page:166-171
Angle Detection Type Atomic Force Microscope
Liu Qinggang;Ye Shenhua;Satoshi Kiyono;Tohru Oka
Liu Qinggang;Ye Shenhua;Satoshi Kiyono;Tohru Oka
..............page:161-165