1001-8042
2006 Issue 4
Experimental research on dryout point of flow boiling in narrow annular channels
WU Ge-Ping;QIU Sui-Zheng;SU Guang-Hui;JIA Dou-Nan;LU Dong-Hua
WU Ge-Ping;QIU Sui-Zheng;SU Guang-Hui;JIA Dou-Nan;LU Dong-Hua
..............page:252-256
Study on severe accident mitigation measures for the development of PWR SAMG
ZHANG Kun;CAO Xue-Wu;CHE Ji-Yao
ZHANG Kun;CAO Xue-Wu;CHE Ji-Yao
..............page:245-251
Magnet lattice design of the SSRF electron-beam transfer lines
HAN Yi-Ang;LIU Gui-Min;LI De-Ming
HAN Yi-Ang;LIU Gui-Min;LI De-Ming
..............page:193-197
Primary study on holdup measurement of 235U in pipe using γ-ray spectrometry and Monte Carlo simulation
WU Lun-Qiang;WEI Meng-Fu;ZHANG Lian-Ping;YANG Suo-Long
WU Lun-Qiang;WEI Meng-Fu;ZHANG Lian-Ping;YANG Suo-Long
..............page:241-244
Measurement of cathode surface temperature using the method of CCD imaging in arc discharge
LI Hui;WANG Chuan-Bing
LI Hui;WANG Chuan-Bing
..............page:237-240
Implementing method of optimum front-end conditioner based on Butterworth filter
ZHANG Ruan-Yu;LUO Xiao-Bing;LI Tai-Hua
ZHANG Ruan-Yu;LUO Xiao-Bing;LI Tai-Hua
..............page:232-236
Acute exposure to high-peak-power pulsed microwaves affecting the histamine H3 receptor expression in rat hippocampus
YU Xiao-Dong;LI Bo;LI De-Hua;HE Qi-Yi;YU Zheng-Ping
YU Xiao-Dong;LI Bo;LI De-Hua;HE Qi-Yi;YU Zheng-Ping
..............page:227-231
Apoptosis and necrosis of HeLa cells in response to low-energy ion radiation
ZHANG Feng-Qiu;YA Hui-Yuan;LI Jing-Yuan;PENG Jian-Jun;FANG Hua-Sheng;SU Ming-Jie;QIN Guang-Yong
ZHANG Feng-Qiu;YA Hui-Yuan;LI Jing-Yuan;PENG Jian-Jun;FANG Hua-Sheng;SU Ming-Jie;QIN Guang-Yong
..............page:222-226
..............page:217-221
Surface XPS-investigations of tobacco leaves treated with low-temperature plasma
SHAO Guo-Quan;HUANG Huan;HONG Shen-Qiu;FU Sheng-Quan;LI Sheng-Qun;YAO Zhong-Da;LI Chang-Xing
SHAO Guo-Quan;HUANG Huan;HONG Shen-Qiu;FU Sheng-Quan;LI Sheng-Qun;YAO Zhong-Da;LI Chang-Xing
..............page:212-216
Probing Co/Si interface behaviour by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM)
PAN J. S;LIU R. S;TOK E. S
PAN J. S;LIU R. S;TOK E. S
..............page:202-211
Shielding calculation for the thickness of the SR facility safety shutter
WEI Zhong-Yuan;LUO Wen-Yun;CHEN Tao
WEI Zhong-Yuan;LUO Wen-Yun;CHEN Tao
..............page:198-201