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Optics and Precision Engineering
1004-924X
1999 Issue 5
Comparison Between the Use of Roundness Measuring Instrument and V-type Method in Measuring the Axis' Roundness
LIU Wei
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page:135
The Equipment forOptoelectronic Spy System for Quantitative Testing
TU Da-Wei;TAO Jing
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page:129-134
Algorithms for Wavefront Fitting UsingZernike Polynomial
YAN Jing-Zhou;LEI Fan;ZHOU Bi-Fang;GAO Zhi-Qiang
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page:119-128
AStudy on Video Interpretation Based on Multimedia
LI Qing-Jun
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page:114-118
Error Analysis on Two-wavelength White-light Phase-shifting interferometry
ZHOU Ming-Bao;LIN Da-Jian;GUO Lu-Rong;GUO Yong-Kang
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page:106-113
Two-dimensionalPhase Unwrapping Algorithms
CAO Yuan;WEI Chun-Long;CHENG Wei-Ming;CHEN Ming-Yi
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page:100-105
Indoor Measurement Techniques for the Stabilizing Accuracy of Aiming Line of Image Stabilizer
LIU Zheng-Yun;SU Jian-Gang
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page:95-99
The Three-error Axis of The odolite with the Utilization of the Coordinate to the Variation
JIN Guang;WANG Jia-Qi;NI Wei
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page:89-94
Development of Wiring Equipment With Fixed Tension on Dewar Bottle
GAO Jun-Jie;LI Xiu-Fen;LI Yan-Qing;LI Chun-Yao
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page:85-88
Application of UFDon Polishing Surfaces with Sub-nanometer Scale Roughness
GAO Hong-Gang;Wang Jian-Ming
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page:80-84
Polishing Performance Comparison of Small Polishing Pad Worked in Different Motion Modelin Computer Controlled Optical Polishing
WANG Quan-Dou;YU Jing-Chi;ZHANG Feng;LIU Min-Cai
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page:73-79
Study of Microfabrication and Error Calibration for Multilevel Diffractive Optical Element by Thin Film Deposition
FU Yong-Qi;ZHAO Jing-Li;LI Ji-Xue;ZHANG Xin;ZHENG Xuan-Ming
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page:67-72
Application of the Excimer Laser Etching Technology in Micromachine
LIANG Jin-Qiu;YAO Jin-Song
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page:63-66
Application of the Time Series Analysis Method to Six-component Test Set
ZHANG Hong-Wei
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page:56-62
Modeling and Simulation of Electromechanical System with Cam Mechanism
LI Xing-Hua;ZHAI Lin-Pei
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page:49-55
A Study on Equivalent Test Model of a Space Camera
WANG Jun;LU E;WANG Jia-Qi;Li li-qiang
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page:43-48
A Distorted Pixels Correlation Correcting Method Based on the Characteristic of HRIS Images
WANG Xue-Liang
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page:37-42
The Vector Theory AnalysisofBinary GratingsDiffraction Characteristics
FAN Shu-Wei
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page:30-36
Analysis of Non-Vision 3-D Coordinates Measuring Methods with Feature Points onLarge-scale Workpiece
ZHU Shi-Ping;SHEN Gong-Xun;SUN Xiao-Ming;QIANG Xi-Fu
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page:22-29
Modern Small Satellites and Its Related Technology
GAO Yun-Guo
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page:16-21
Error-Correcting Problem of Solid State Image Data RecorderApplied in Space
ZENG Xiao-Yang;Hao Zhi-Hang
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page:9-15
Magnetorheological Finishing Technology
ZHANG Feng;YU Jing-Chi;ZHANG Xue-Jun;WANG Quan-Dou
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page:1-8