Foreign Electronic Measurement Technology 2005 Issue 8 Determining Optimal Testing Time in Software Testing

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Foreign Electronic Measurement Technology
1002-8978
2005 Issue 8

Determining Optimal Testing Time in Software Testing

..............page:34-36

The Host Interface Design of Multi-DSP Processor

..............page:29-33

Design and Atudy on xDSL Analyzer of Single-ended Frequency Response Test

..............page:25-28

Automatic Detecting of the Wind Vector

..............page:22-24

Design of Virtual Wavelet Noise Eliminator Based on LabVIEW Technology

..............page:18-21

Development for Remote Net Communication of Virtual Instrument

..............page:14-17,33

A Fast Solution of Digital Filter Design Based on TMS320F2812

..............page:12-13

Zero-phase Digital Filter and Application

..............page:9-11

News & Information

..............page:21,44,49-52

You talk about system-ready instruments.how is LXI different

..............page:49

Application of EWB in Error Analysis of the Instrument for Testing Pull or Pressure

..............page:45-48

Digital CATV MER TEST

..............page:42-44

Design of Shock Absorption Circuit for Optical Encoder Using Microprocessor

..............page:39-41

An Electricity Checks Meter System Based on CAN Bus

..............page:37-38

Identity Authentication Based on Hand Geometry

..............page:4-8

Problems of MEMS Testing

..............page:3

Introduction to a New Standard for ATE Information Exchange ATML

..............page:1-2