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Optoelectronic Technology
1005-488X
1987 Issue 1
Fundamentals of AC Thin-Film Electroluminescent Displays
Tian Zhiren Nanjing Electron Devices Research Institute
..............page:1-13
Emissivity Measurement of Materials by Infrared Thermography
Chen Jue Nanjing Institute of Technology
..............page:14-17+39
3-Phase Polysilicon Overlay-Gate Buried-Channel CCD
Chen Muzhang;Li Zuojin and Liu Banghan Zhongqing Research Institute of Electro-Optics
..............page:18-22+51
Impossible: Preparation for NEA Polycrystalline Photoemissive Layers
Xue Zengquan Beijing University
..............page:23-28+44
Vidicon Response to the Pulse Illumination
Lu Dingxian Nanjing Electron Devices Research Institute
..............page:29-33
A Scanning Circuit of the Cameras for Spectrum Measurement
Shen Hong Nanjing Electron Devices Research Institute
..............page:34-39
da mian ji dian zhen dian zhi bian se xian shi qi
zheng cai ;
..............page:45-48
mei xiang su san dian ji jiao liu deng li zi ti xian shi ban
wu zheng hua ;
..............page:52-56+60
ye jing xian shi you yuan ju zhen de gai jin she ji
chen xiang zhen ;
..............page:57-60
gaas guang yin ji /ccd zuo he de wei guang dian shi tan ce qi
wen zeng fu ;
..............page:61-63+91
yong yu ya hao mi bo duan de re dian she xiang guan
he shu zuo ;
..............page:64-70
wu ding xing gui jin tie shi tu xiang chuan gan qi
shen guo qing ;
..............page:71-75
ccd cheng xiang
feng bo ru ;
..............page:76-78+83
dian zi guang xue xin jin zhan
tan zuo qiong ;
..............page:84-86
gao xing neng gu ti she xiang qi jian
sheng bai zuo ;
..............page:91