Electronics Quality 2005 Issue 3 EMC Design of BLDCM Experimental Platform

EMC Design of BLDCM Experimental Platform
Wang Yan-Ping

..............page:70-71

Printed Circuit Board Design for Digital Power Amplifier
CHEN Shou-cai;Luo Li-hong;Yuan Li-hui

..............page:72-73

Analysis and EMC Design of Capacitors in High-Speed Circuit
Ding Gao;Kan De-Peng;Wu Chao

..............page:74-75,62

Which Aspects Should be done in the Implementation Process of Guideline?

..............page:76

What does the Recommending Standard Refer to?

..............page:76

The Rectifying Record of EMC Fundamental Test for the Certain Exchanging Equipment Brand
Gu Hai-zhou

..............page:68-69

The Analysis of Impact Brought by the SA8000 Certification to Chinese Manufacture and Relevant Stregics
Zheng Xin;Tong Sheng;Yun Liu-ying

..............page:65-67,76

UL Restarted Certification Service for SA8000
Wang Lei

..............page:63-64

The Introduction of SA8000 Standard (Social Accountability 8000)
Bo Wei-hua

..............page:60-62

The China RFID has Finished Part of the Test; the Relevant Standard Would be Promulgated Within 2005

..............page:59

The China National Standard for Nanometer Material will Come into Force in April 1 etc.

..............page:57-59

The Society Pay Attention to the Quality Management of Electronics Industry

..............page:56,59

The Clash of Quality Theory and Practice
Luo Si-na

..............page:55

The Special Report: The Clarion in the new century: China Electronics Industry is Growing into the Strong one!
Chen Xin-cheng

..............page:53

zhi liang , ren he wo men de shi jie
Dave William Smith

..............page:52

ren yu pin zhi -- xin de shang ye zhe xue
yang gang

..............page:49-51,33

yi shi chang wei zhu dao , yi ke hu man yi du wei gen ben de jing ying yu guan li
gao tai ri

..............page:47-48,53

cong da q lun zhong guo qi ye de zhi liang guan li
zhou fu qiu

..............page:46

hai er de jing ying zhan lue yu zhi liang guan li
liang hai shan

..............page:44-45

The Opening Presentation for the First International Forum for Electronic Quality
Wen Ku

..............page:43

The Implementation Report of Brazil National Quality Medal
Shi Gui-lan;Zhou Xiao-ping

..............page:39-42,43

Go Towards the Profit-oriented Development with the Highlight of Quality Management
Qian Jun-hu;Xia Li-xin

..............page:37-38,36

A NHPP Software Reliability Growth Model Incorporating Test Coverage and Fault Removal Efficiency
Li Chun-zhi;Yue Xiao-guang;Liu Hong-wei

..............page:34-36

The Recent Development of Algorithms about Consecutive-k-out-of-n:F Systems
Sun Zhi-sen

..............page:31-33

Application of DFMEA in the Communication Switch Power Supply
Zhang Zeng-qiang

..............page:27-30

Keithley Introduced the Third Generation Measurement Function for the RF of Wafer etc.

..............page:26

NIST Developed the New Standard in Measurement etc.

..............page:24-26

How to Choose and Install the Protective Devices of Household Appliances
Huang Bi-feng

..............page:23-23,3

The Existed Problems and the Solutions in the Heat-generation and Abnormal Working Test for the Deep Fringing Pan and Flat Fringing Pan
Chen Tong-xiang

..............page:21-22

dB Measurement of Analogy Multimeter
Zuo Xian-long

..............page:19-20

The lectotype Method for the Test System of Electronic Components
Sun Xian

..............page:13-18

The Principle of a New Harmonic Analyzer
Wang Sheng-dong;Qin Juan-ying

..............page:1-3

Applying a new type of Single-chip to High Precision Measure System of Difference in Temperature
Yu Hua-fang;ZHANG Wen-Hao

..............page:4-5

The Interface GPIB in the Data Transfer Circuit
Liu Cui-xiang

..............page:6-7,12

Low Power Design of Mixed-mode BIST Based on Folding Set
Chen Wei-bing

..............page:8-10

Discussion about Dielectric Strength Test of Military Communication Equipment
Wang Run-hong;ZHOU Hong-zhi

..............page:11-12