Electronics Quality 2005 Issue 2 IIR Digital Dilter Design Based on Embeded Microcomputer M68HC11

IIR Digital Dilter Design Based on Embeded Microcomputer M68HC11
Gao Feng-yang;Li Qiang

..............page:65-67

The Anti-disturbance Technology in the Lab of Auto-control System
Wang Ya-ping

..............page:68-69,62

The Anti-jamming Design for the Control Panel of Air Conditioner
Zheng Fei-xia

..............page:70-72

EMC Design of a Type of Telecommunication Equipment
Ye Xiao-zhou

..............page:73-75

How Many Ways are there in the Selective Sample Inspection to 75Ensure the Product Quality?/How Many Aspects of Product should be Considered in the Selection of Inspection Level?

..............page:75

The Relative Strategy of "WEEE" and "RoHS" Directives
Kato Hirokazu;BIE Zheng-Ye

..............page:63-64

The Correspondent Draft: Satisfy the Clients and be the Pioneer in Certification Service the　Reporter
Electronics Quality Reporter

..............page:61-62

Simple Analysis of Difference for New and Old Version about GJB1o42A General Specification for Electromagnetic Relays
Zhao Gui-ping

..............page:58-60

Differences Between ISO14001:2004 and ISO14001:1996
Chen Qing-jin;Zhang Yue-ping

..............page:55-57,67

How to Analyse the Data of Household Appliances Interlaboratory Proficiency Testing
Huang Bi-feng

..............page:52-54,72

The First International Forum For Electronic Quality & Top100 Electronic Enterprises For Quality In China Evaluation Activity/To be a Power is an ideal, to be the Strongest one is the Final goal!

..............page:51

The 2005 International ISO9000 Conference will be Held in the USA/The First Short-distance Wireless LAN in China was Confirmed Internationally

..............page:49-50

The Management of the R&D Team in the Enterprise
An Yi;Wang Ying

..............page:47-48

The Differences and Work Division Between QA and QC in Information Industry
Yan Xiao-guang

..............page:46-46,34

The Process Control and Increase of Products Quality--Analyzing the Process Control of Wuhan Bluestar Computer Co, Ltd.
Ye Jun;Li Yan

..............page:42-45

How to Implement the Six Sigma Quality Strategy in the Chinese Enterprises Efficiently
Shen Yan

..............page:39-41

Quality Control In TaiBai Chemical Factory
Fan Yan-Jun;Sun Li;Zhang Jing;Mao Zong-Yuan

..............page:37-38

The Quality Improvement of 21FS CPT Convergence
Qian Xiao-qing;Xu Zhen

..............page:35-36,45

The Reliability Test for the Electronic Equipment Products
Ding Xiao-dong

..............page:32-34

Keep pace with the Times, we ake Cognizance of Electronic Equipment Reliability Index
Gu Hai-zhou

..............page:29-31

Germany Huge X-ray Faultage Detector would Initiate the Human Body Experiment/Anritsu Debuts the High frequency RF Wireless Signal Analyzer

..............page:27-28,20

The Application the Test System and Relevant Apparatuses/devices in the R&D Process of Mobile Phone
Zhang Feng;Luo Xiang-yuan

..............page:24-26

Difference Scatter Parameter in the RF Circuit of Mobile by Means of the Single Terminal Vector Network Analyzer
Hu Kai

..............page:22-23

Void Detection System Ferrets Out Hidden Defects
YANG Jian-sheng;Chen Jian-jun

..............page:21,9

Aeroflex Fastbit Code Rate Error Analyzer-Wireless Digital Communication Testing Equipment
Li Gao Apparatusee Co.Ltd

..............page:18-20

Phase Noise and It's Measurement Techniques
Chen Guo-long

..............page:16-17,11

On-line Infrared Temperature Measurement System Based on Delphi7.0
Xia Ke-fen;Huang Dao-ping

..............page:14-15

The Design of QCM System for Medical Applications
Liu Zhen;Wang Pan;Ding Ke-xiang

..............page:12-13,23

Application of DSP in GSM Test System
Fan Hua-Zhong;Guo Xiao-Dong

..............page:10-11

Low Power Design of Folding Controller
Chen Wei-bing;Liu Wen-yan

..............page:7-9

Applying the path Analysis Methodology in the System Testing
Li Xiao-min;Liu Hui-fang

..............page:4-6

Design of Virtual Measuring System for Water Temperature on LabVIEW
LiuJin-peng;CaoYu-qiang;Sun Qing

..............page:1-3