1672-5468
2016 Issue 3
The Military Standard System of Electronic Components in Our Country Must Be Reformed
ZHENG Peng-zhou;
ZHENG Peng-zhou;
..............page:1-6
Discussion on the Cold Soak in Reliability Test and Cold Design Methods of Electronic Products
ZHOU Min;,ZENG Qing-guo;,JIANG Feng;,CHEN Zhong-wen;
ZHOU Min;,ZENG Qing-guo;,JIANG Feng;,CHEN Zhong-wen;
..............page:7-12
Analysis of the Damage of Electromagnetic Pulse to the MIM Capacitor in MMIC
DONG Zuo-dian;,SONG Yan;,SHI Guang-qin;,HAN Bao-ni;,TANG Xu;,HE Ting;
DONG Zuo-dian;,SONG Yan;,SHI Guang-qin;,HAN Bao-ni;,TANG Xu;,HE Ting;
..............page:13-18
Failure Analysis of the Solder Point of CBGA during Thermal Cycling
LU Xiao-rui;,LIN Peng-rong;,HUANG Ying-zhuo;,TANG Chao;,LIAN Bin-hao;,YAO Quan-bin;
LU Xiao-rui;,LIN Peng-rong;,HUANG Ying-zhuo;,TANG Chao;,LIAN Bin-hao;,YAO Quan-bin;
..............page:19-22
Research on the Aerospace Applicability of an Embedded Resisor
MAO Xi-ping;,ZHANG Yan-wei;,ZHANG Hong-qi;,WANG Zhi-bin;,KONG Peng;
MAO Xi-ping;,ZHANG Yan-wei;,ZHANG Hong-qi;,WANG Zhi-bin;,KONG Peng;
..............page:23-28
The Method of Improving the Reliability of Microwave Power Devices
FENG Bin;,PAN Hong-shu;
FENG Bin;,PAN Hong-shu;
..............page:29-32
Research on the Fuzzing Test Method of Industrial Configuration Software
WU Bo;,YUN Lei;,JIN Xian-tao;,LIU Bei-shui;
WU Bo;,YUN Lei;,JIN Xian-tao;,LIU Bei-shui;
..............page:33-38
..............page:39-44
Research on the Accelerated Degradation Test of Analog IC Based on Constant Temperature Stress
WU Zhao-xi;,LI Xiao-hong;,DENG Yong-fang;,CAI Jian-rong;,YANG Shao-hua;
WU Zhao-xi;,LI Xiao-hong;,DENG Yong-fang;,CAI Jian-rong;,YANG Shao-hua;
..............page:45-48
Reliability Natural Growth Test Method of Electromechanical Product
SU Guo-qing;,ZHENG Li-sheng;,LI Xiao-bing;
SU Guo-qing;,ZHENG Li-sheng;,LI Xiao-bing;
..............page:49-53
Research on the FMECA Method Suitable for Testability Test
ZENG Li;,WANG Xiao-lin;
ZENG Li;,WANG Xiao-lin;
..............page:54-60
Burn-in Test Technique of MIC
REN Jun-hua;,ZHAO Xin-yi;,WANG Hong-ying;
REN Jun-hua;,ZHAO Xin-yi;,WANG Hong-ying;
..............page:61-64
Reliability Prediction Method of Smart Meter
YANG Hong-qi;,LIU Shao-qing;,HUANG Jin-yong;
YANG Hong-qi;,LIU Shao-qing;,HUANG Jin-yong;
..............page:65-71
Summary of Designing Reliability Test Profile Based on Measured Data
WANG Xue-kong;,JIANG Lu;,ZHANG Zhong-wen;,ZHONG Yun-long;,XIE He;
WANG Xue-kong;,JIANG Lu;,ZHANG Zhong-wen;,ZHONG Yun-long;,XIE He;
..............page:72-75
Reliability Simulation Technology and Software Design Based on Physics of Failure
LIANG Yi-kun;,HU Ning;,HUANG Jin-yong;,YU Zhao-jie;
LIANG Yi-kun;,HU Ning;,HUANG Jin-yong;,YU Zhao-jie;
..............page:76-79
Discussion on the Problems of "Verification Regulation of Universal Bevel Protractors"
SHUI Qing-bo;
SHUI Qing-bo;
..............page:80-82
..............page:83
..............page:后插1-后插2