1672-5468
2012 Issue 6
..............page:54-57
Failure Cause Research on IC Open and Short Circuit
LI Xing-hong;ZHAO Jun-ping;ZHAO Chun-rong;LAI Shi-bo
LI Xing-hong;ZHAO Jun-ping;ZHAO Chun-rong;LAI Shi-bo
..............page:20-24
Review of Accelerated Test Engineering Application
YANG Yu-xing;CHENG De-bin
YANG Yu-xing;CHENG De-bin
..............page:44-47
The 50 Years' History of Reliability Technology in China
SHENG Zhi-sen
SHENG Zhi-sen
..............page:1-3
..............page:48-53
Outfield Failure Data Analysis and Reliability Assessment for Large-scale Weapon Equipment
SHEN Zheng-rong;SHI Zhong
SHEN Zheng-rong;SHI Zhong
..............page:29-34
..............page:3,8,12,19,24,28,34,39,53,60,64-65,后插1-后插2
..............page:40-43
Research on Reliability Simulation Test Technology Application of High Reliability Electronic Equipment
ZHANG Rui;WANG Kai-wei;SHEN Zheng-rong
ZHANG Rui;WANG Kai-wei;SHEN Zheng-rong
..............page:13-19
Research on Tethered Balloon' s Platform and Reliability Technology
QIAN Jie;LIU Zhi-gao;HUANG FU Liu-cheng;PENG Wei
QIAN Jie;LIU Zhi-gao;HUANG FU Liu-cheng;PENG Wei
..............page:35-39
A Design for I2C Interface Expander
QIU Yong-hua
QIU Yong-hua
..............page:61-63
Study on the Detection of Movable Remnant Particles in the Cavity of Electronic Vacuum Device
LI Rong;SHANG Shao-huan
LI Rong;SHANG Shao-huan
..............page:9-12
An Experimental Method for Scaling the Maximum Ripple Current Capability for Chip Tantalum Capacitors
PAN Qi-feng;ZHANG Hong-qi;CHEN De-shun;DEN Rui-xue
PAN Qi-feng;ZHANG Hong-qi;CHEN De-shun;DEN Rui-xue
..............page:4-8
Research on Quality Evaluation Model for Software Testing & Evaluating System
LUO Yin;BIN Jian-wei;YAO Ri-huang
LUO Yin;BIN Jian-wei;YAO Ri-huang
..............page:58-60
An Economically Precise Reliability Evaluation Method for Electronic Equipment
ZHANG Dao-ping;MA Jing-guang
ZHANG Dao-ping;MA Jing-guang
..............page:25-28